| Part Number | SN74ACT8997 |
| Manufacturer | Texas Instruments |
| Title | SCAN-PATH LINKERS |
| Description | The ’ACT8997 are members of the Texas Instruments SCOPE™ testability integratedcircuit family. This family of components facilitates testing of c... |
| Features |
TMS1 8 DTMS2 9 DTMS3 10 DTMS4 11 DTCK 12 TDO 13 TMS 14
28 DCI 27 MCI 26 TRST 25 ID1 24 ID2 23 ID3 22 ID4 21 VCC 20 DTDI1 19 DTDI2 18 DTDI3 17 DTDI4 16 TDI 15 TCK
SN54ACT8997 . . . FK PACKAGE (TOP VIEW)
ID1 ID2 ID3 ID4 V CC DTDI1 DTDI2
description
The ’ACT8997 are members of the Texas Instrument...
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| File Size | 565.82KB |
| Datasheet |
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SN74ACT8990 : The ’ACT8990 test-bus controllers (TBC) are members of the Texas Instruments SCOPE™ testability integrated-circuit family. This family of components supports IEEE Standard 1149.1-1990 (JTAG) boundary scan to facilitate testing of complex circuit-board assemblies. The ’ACT8990 differ from other SCOPE™ integrated circuits. Their function is to control the JTAG serial-test bus rather than being target boundary -scannable devices. The required signals of the JTAG serial-test bus – test clock (TCK), test mode select (TMS), test data input (TDI), and test data output (TDO) can be connected from the TBC to a target device without additional logic. This is done as a chain of IEEE Standard 1149.1-199.