Part Number
|
SN74LVC2G00W-EP |
Manufacturer
|
Texas Instruments |
Description
|
DUAL 2-INPUT POSITIVE-NAND GATE |
Published
|
Feb 5, 2020 |
Detailed Description
|
www.ti.com
FEATURES
• Controlled Baseline
– One Assembly/Test Site, One Fabrication Site
• Extended Temperature Performa...
|
Datasheet
|
SN74LVC2G00W-EP
|
Overview
www.
ti.
com
FEATURES
• Controlled Baseline
– One Assembly/Test Site, One Fabrication Site
• Extended Temperature Performance of –55°C to 115°C
• Enhanced Diminishing Manufacturing Sources (DMS) Support
• Enhanced Product-Change Notification • Qualification Pedigree (1) • Supports 5-V VCC Operation • Inputs Accept Voltages to 5.
5 V • Max tpd of 5.
3 ns at 3.
3 V • Low Power Consumption, 10-µA Max ICC
(1) Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range.
This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, b...
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