Part Number
|
SN74LVC2G34-EP |
Manufacturer
|
Texas Instruments |
Description
|
Dual Buffer Gate |
Published
|
Feb 5, 2020 |
Detailed Description
|
www.ti.com
FEATURES
• Controlled Baseline – One Assembly Site
– One Test Site
– One Fabrication Site • Extended Temperat...
|
Datasheet
|
SN74LVC2G34-EP
|
Overview
www.
ti.
com
FEATURES
• Controlled Baseline – One Assembly Site
– One Test Site
– One Fabrication Site • Extended Temperature Performance of –55°C
to 125°C • Enhanced Diminishing Manufacturing Sources
(DMS) Support • Enhanced Product-Change Notification • Qualification Pedigree (1)
(1) Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range.
This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life.
Such qualification testing should not be viewed as justifying use of th...
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