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Provisional Data Sheet No.
PD-9.
1432A
REPETITIVE AVALANCHE AND dv/dt RATED
IRHNA7264SE
N-CHANNEL
HEXFET
®
TRANSISTOR
SINGLE EVENT EFFECT (SEE) RAD HARD
250Volt, 0.
110 Ω, (SEE) RAD HARD HEXFET
International Rectifier’s (SEE) RAD HARD technology HEXFETs demonstrate virtual immunity to SEE failure.
Additionally, under identical pre- and post-radiation test conditions, International Rectifier’s RAD HARD HEXFETs retain identical electrical specifications up to 1 x 105 Rads (Si) total dose.
No compensation in gate drive circuitry is required.
These devices are also capable of surviving transient ionization pulses as high as 1 x ...