TND307 Graphical Data Test Circuits for the NCP1650 Prepared by Alan Ball ON Semiconductor Applications Engineering http://onsemi.
com The following circuits are the test configurations that were used to obtain the data for the graphical section of the NCP1650/D data sheet.
Each graph has a schematic associated with it and in some cases a description of the procedure.
14 V 1 mF 300 0 to –5 V Iavg Iavg fltr 10 11 1 nF 0–5 V 0–5 V 10 1k APPLICATION NOTE 30 k 0.
5 mF 0–5 V 0.
1 mF com 47 k Ramp GND CT Comp 15 k 15 14 13 10 k 470 pF 47 k 1 Vin 3 AC Comp 4 Ref Filter 5 AC Input 6 FB/SD 7 Loop Comp 8 Pcomp 9 Pmax 2 0.
1 mF Vref NCP1650 16 Output 12 IS– 30 k 0.
05 mF Ramp GND...

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