| Part Number | IRHM7260 |
| Manufacturer | International Rectifier |
| Title | RADIATION HARDENED POWER MOSFET THRU-HOLE |
| Description | www.datasheet4u.com PD - 91332D RADIATION HARDENED POWER MOSFET THRU-HOLE ( T0-254AA) Product Summary Part Number IRHM7260 IRHM3260 IRHM4260 IRH... |
| Features |
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Single Event Effect (SEE) Hardened Low RDS(on) Low Total Gate Charge Proton Tolerant Simple Drive Requirements Ease of Paralleling Hermetically Sealed Ceramic Package Light Weight
Absolute Maximum Ratings
Parameter
ID @ VGS = 12V, TC = 25°C ID @ VGS = 12V, TC = 100°C IDM PD @ TC...
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| File Size | 301.09KB |
| Datasheet |
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IRHM7260 : PD - 91332D RADIATION HARDENED POWER MOSFET THRU-HOLE ( T0-254AA) Product Summary Part Number IRHM7260 IRHM3260 IRHM4260 IRHM8260 Radiation Level R DS(on) 100K Rads (Si) 0.070Ω 300K Rads (Si) 0.070Ω 600K Rads (Si) 0.070Ω 1000K Rads (Si) 0.070Ω ID 35*A 35*A 35*A 35*A REF: MIL-PRF-19500/663 ® RAD Hard HEXFET TECHNOLOGY IRHM7260 JANSR2N7433 200V, N-CHANNEL QPL Part Number JANSR2N7433 JANSF2N7433 JANSG2N7433 JANSH2N7433 TO-254AA International Rectifiers RADHard HEXFET® technology provides high performance power MOSFETs for space applications. This technology has over a decade of proven performance and reliability in satellite applications. These devices have been characterized for both T.
IRHM7264SE : Previous Datasheet Index Next Data Sheet Provisional Data Sheet No. PD-9.1393A REPETITIVE AVALANCHE AND dv/dt RATED IRHM7264SE N-CHANNEL HEXFET® TRANSISTOR SINGLE EVENT EFFECT (SEE) RAD HARD 250 Volt, 0.087Ω, (SEE) RAD HARD HEXFET International Rectifier’s (SEE) RAD HARD technology HEXFETs demonstrate virtual immunity to SEE failure. Additionally, under identical pre- and post-radiation test conditions, International Rectifier’s RAD HARD HEXFETs retain identical electrical specifications up to 1 x 105 Rads (Si) total dose. No compensation in gate drive circuitry is required. These devices are also capable of surviving transient ionization pulses as high as 1 x 1012 Rads (Si)/Sec, and re.