Part Number
|
SCAN18373T |
Manufacturer
|
National Semiconductor |
Description
|
Transparent Latch with TRI-STATE Outputs |
Published
|
Apr 8, 2005 |
Detailed Description
|
SCAN18373T Transparent Latch with TRI-STATE Outputs
September 1998
SCAN18373T Transparent Latch with TRI-STATE ® Outpu...
|
Datasheet
|
SCAN18373T
|
Overview
SCAN18373T Transparent Latch with TRI-STATE Outputs
September 1998
SCAN18373T Transparent Latch with TRI-STATE ® Outputs
General Description
The SCAN18373T is a high speed, low-power transparent latch featuring separate data inputs organized into dual 9-bit bytes with byte-oriented latch enable and output enable control signals.
This device is compliant with IEEE 1149.
1 Standard Test Access Port and Boundary Scan Architecture with the incorporation of the defined boundary-scan test logic and test access port consisting of Test Data Input (TDI), Test Data Out (TDO), Test Mode Select (TMS), and Test Clock (TCK).
Features
n n n n n n n n n n IEEE 1149.
1 (JTAG) Compliant Buffered active-low l...
Similar Datasheet