D Member of the Texas Instruments Widebus Family D Compatible With IEEE Std 1149.
1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture D Includes D-Type Flip-Flops and Control Circuitry to Provide Multiplexed Transmission of Stored and Real-Time Data D Two Boundary-Scan Cells Per I/O for Greater Flexibility SN74ABT18646 SCAN TEST DEVICE WITH 18-BIT TRANSCEIVER AND REGISTER SCBS131A – AUGUST 1992 – REVISED JANUARY 2002 D SCOPE Instruction Set – IEEE Std 1149.
1-1990 Required Instructions, Optional INTEST, and P1149.
1A CLAMP and HIGHZ – Parallel Signature Analysis at Inputs With Masking Option – Pseudorandom Pattern Generation From Outputs – Sample Inputs/Toggle Outputs – Binary Coun...

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