SN54ABT8646, SN74ABT8646 SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND REGISTERS SCBS123F − AUGUST 1992 − REVISED APRIL 2004 D Members of the Texas Instruments SCOPE  Family of Testability Products D Compatible With the IEEE Standard 1149.
1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture D Functionally Equivalent to ’F646 and ’ABT646 in the Normal-Function Mode D SCOPE  Instruction Set − IEEE Standard 1149.
1-1990 Required Instructions, Optional INTEST, CLAMP, and HIGHZ − Parallel-Signature Analysis at Inputs With Masking Option − Pseudorandom Pattern Generation From Outputs − Sample Inputs/Toggle Outputs − Binary Count From Outputs − Even-Parity Opcodes D Two Boundary-Scan...

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