SN54ABTH18646A, SN54ABTH182646A, SN74ABTH18646A, SN74ABTH182646A SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS SCBS166D – AUGUST 1993 – REVISED JULY 1996 D Members of the Texas Instruments SCOPE ™ Family of Testability Products D Members of the Texas Instruments Widebus ™ Family D Compatible With the IEEE Standard 1149.
1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture D Include D-Type Flip-Flops and Control Circuitry to Provide Multiplexed Transmission of Stored and Real-Time Data D Bus Hold on Data Inputs Eliminates the Need for External Pullup Resistors D B-Port Outputs of ’ABTH182646A Devices Have Equivalent 25-Ω Series Resistors, So No External Resistors Are Requi...

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