SN54BCT8373A, SN74BCT8373A
SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES
SCBS044F – JUNE 1990 – REVISED JULY 1996
D Members of the Texas Instruments
SCOPE ™ Family of Testability Products
D Octal Test-Integrated Circuits D Functionally Equivalent to ’F373 and
’BCT373 in the Normal-Function Mode
D Compatible With the IEEE Standard
1149.
1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture
D Test Operation Synchronous to Test
Access Port (TAP)
D Implement Optional Test Reset Signal by
Recognizing a Double-High-Level
Voltage (10 V ) on TMS Pin
D SCOPE ™ Instruction Set
– IEEE Standard 1149.
1-1990 Required Instructions, Optional INTEST, CLAMP, and HIGHZ
– Parallel Signature Analysis at In...