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SN74SSTV32867-EP 26-BIT REGISTERED BUFFER WITH SSTL_2 INPUTS AND LV
CMOS OUTPUTS
SCES664 – SEPTEMBER 2006
FEATURES
• Controlled Baseline
– One Assembly/Test Site, One Fabrication Site
• Extended Temperature Performance of –40°C to 85°C
• Enhanced Diminishing Manufacturing Sources (DMS) Support
• Enhanced Product Change Notification
• Qualification Pedigree (1)
• Member of the Texas Instruments Widebus+™ Family
(1) Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range.
This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiase...