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A1365

Allegro
Part Number A1365
Manufacturer Allegro
Description Programmable Linear Hall-Effect Sensor
Published Sep 19, 2016
Detailed Description A1365 Low-Noise, High-Precision, Programmable Linear Hall-Effect Sensor IC with High-Bandwidth (120 kHz) Analog Output a...
Datasheet PDF File A1365 PDF File

A1365
A1365

Overview
A1365 Low-Noise, High-Precision, Programmable Linear Hall-Effect Sensor IC with High-Bandwidth (120 kHz) Analog Output and Integrated Fault Comparator with Self-Test Diagnostic Mode FEATURES AND BENEFITS • Proprietary segmented linear temperature compensation (TC) technology provides a typical accuracy of 1% over the full operating temperature range • Self-Test diagnostic mode can be used to achieve a high level of functional safety within a system • 120 kHz nominal bandwidth achieved via proprietary packaging and chopper stabilization techniques • Over Field Fault signal with 6-bit programmable trigger levels, 2-bit programmable hysteresis, and latching or non-latching behavior • Over Field Fault response time < 4.
5 μs (typ) • Extremely low noise and high resolution achieved via proprietary Hall element and low-noise amplifier circuits • Customer-programmable, high-resolution offset and sensitivity trim • Available in a 1-mm-thick SIP through-hole package Continued on the next page… PACKAGE: 4-pin SIP (suffix KT) TN Leadform TF Leadform TG Leadform Not to scale DESCRIPTION The A1365 linear output Hall-effect sensor IC is specifically designed to provide a highly accurate output with improved resolution at high bandwidth for use in current-sensing applications.
This device employs a segmented, linearly interpolated temperature compensation technology, which provides greater accuracy in sensitivity and offset voltage trimming and hence virtually zero temperature drift.
This improvement greatly reduces the total error of the device across the operating temperature range.
A user-activated Self-Test diagnostic mode verifies the A1365 Sensitivity and Over Field Fault functionality and can be used to achieve a high level of functional safety in application.
The highly programmable Over Field Fault signal (FAULT pin) can be used to detect a high magnetic field condition.
Broken ground wire detection, undervoltage lockout for VCC below specification, and user-...


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