D Member of the Texas Instruments
Widebus Family
D Compatible With IEEE Std 1149.1-1990
(JTAG) Test Access Port and
Boundary-Scan Architecture
D Includes D-Type Flip-Flops and Control
Circuitry to Provide Multiplexed
Transmission of Stored and Real-Time Data
D Two Boundary-Scan Cells Per I/O for
Greater Flexibility
SN74ABT18646 SCAN TEST DEVICE WITH 18-BIT...
