ONLY MEMORY. UPD23128 Datasheet

UPD23128 MEMORY. Datasheet pdf. Equivalent


NEC UPD23128
NEe
NEe Microcomputers, Inc.
}LPD23128
~rn~[~~~~ffirnW
FULLY DECODED 128K BIT MASK
PROGRAMMABLE READ ONLY MEMORY
OESCR I PTION
The NEC IlPD23128 is a high speed 128K bit mask programmable Read Only Memory
organized as 16,384 words by 8 bits. The IlPD23128 is fabricated with N·channel
MOS technology.
The inputs and outputs are fully TTL compatible. This device operates with a single
+5V power supply. The chip select input is programmable. An active high or low level
chip select input can be defined and is fixed during the masking process.
II
FEATU RES
16,384 Words x 8 Bits Organization
• Directly TTL Compatible - All Inputs and Outputs
• Single +5V Power Supply
• High Speed - Access Time 250 ns Max.
• Three-State Output - OR-Tie Capability
• One Programmable Chip Select Input for Easy Memory Expansion
• On-Chip Address Fully Decoded
• All Inputs Protected Against Static Charge
• Pin Compatible with 2764
• Available in 28 Pin Ceramic or Plastic Dual-in-Line Package
PIN CONFIGURATION
NC
A12
A7
Ae
A5
A4
Aa
A2
A1
Ao
01
02
03
VCC
CS
AO- A13
01 ~08
CS
00
CE
PIN NAMES
Address Inputs
Data Outputs
Programmable Chip Select
Output Disable
Chip Enable
04
Rev/1
129


UPD23128 Datasheet
Recommendation UPD23128 Datasheet
Part UPD23128
Description FULLY DECODED 128K-BIT MASK PROGRAMMABLE READ ONLY MEMORY
Feature UPD23128; NEe NEe Microcomputers, Inc. }LPD23128 ~rn~[~~~~ffirnW FULLY DECODED 128K BIT MASK PROGRAMMABLE R.
Manufacture NEC
Datasheet
Download UPD23128 Datasheet




NEC UPD23128
J.L PD23128
A13_
A12 ----...
AO
A,
A2 ~
~
A3 iil
e-
A4 O'
~
AS ~
'"A6
Cl
Cl
0(
A7
AS
Ag
AlO
All
BLOCK DIAGRAM
Operating Temperature .... .
Storage Temperature .... .
Supply Voltage On Any Pin, ...
G)Note:
With Respect to Ground.
-10°C to +70°C
. . . . .. -6SoC to +l50°C
. ... -O,S to +7.0 VoltsQ)
ABS()LUn MAXIMUM
PlATINGS*
COMMENT: Stress above those listed under "Absolute Maximum Ratings" may cause permanent
damage to the device. Th is is a stress rating only and fu nctional operation of the device at these or
any other conditions above those indicated in the operational sections of this specification is not
implied. Exposure to absolute maximum rating conditions for extended periods may affect device
reliability.
*Ta= 2SoC
Ta = _lo°C to +70°C, Vee = +5V ± 10%, unless otherwise specified.
PARAMETER
SYMBOL
MIN
LIMITS
TYPQ)
MAX
UNIT
TEST CONDITIONS
Input Load Current
(All Input Pins)
Output Leakage Current
III
ILOH
+10 "A VIN = Vee
-10 "A VIN - OV
+10 "A Chip Deselected, Vo = Vee
Output Leakage Current
ILOL
-10 "A Chip Deselected, VO:: OV
POlNer Supply Current
ICC
100
mA
Input "Low" Voltage
VIL -0.5
0.8 V
Input "High" Voltage
VIH
2.0
Vee + 1.0V
V
Output "Low" Voltage
VOL
0.45
V IOL = 2.1 mA
Output "High" Voltage
VOH
2.2
CDNote:
Typical .Values for Ta '" 25° C and nominal supply voltages.
V IOH = -400 "A
DC CHARACTER ISTICS
130



NEC UPD23128
ILPD23128
CAPACITANCE Ta - 25'C'f= 1 MHz
PARAMETER
Input Capacitance
Output Capacitance
SYMBOL
CIN
COUT
LIMITS
MIN TYP MAX
10
15
UNIT
pF
pF
TEST CONDITIONS
All Pins Except Pin Under
Test Tied to AC Ground
All Pins Except Pin Under
Test Tied to AC Ground
AC CHARACTERISTICS
PARAMETER
SYMBOL
Cycle Tim.
Address Setup Tim.
Referenced toCE
Address Hold Tim.
Referenced to Ce
CE'Pulse Width
00 Pulse Width
Access Time
~ Precharge Time
Output Turn-Off Delay
tCYC
tAS
tAH
tCE
too
tACC
tcc
tDF
MIN TYP
350
0
50
100
0
MAX UNIT
ns
ns
ns
250 ns
120 ns
250 ns
ns
70 ns
TEST CONDITIONS
tAS-Ons
TIMING WAVEFORMS
Ao-12
CS
'AS
'CyC
II
~-----'CE-----e~
00
1 - - - 'ACC ----~
OUTPUT - - - - - - - - - -
'OF
Hi-Z
131







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