PCM4202-EP Datasheet: Analog-to-Digital Converter





PCM4202-EP Analog-to-Digital Converter Datasheet

Part Number PCM4202-EP
Description Analog-to-Digital Converter
Manufacture etcTI
Total Page 29 Pages
PDF Download Download PCM4202-EP Datasheet PDF

Features: PCM4202-EP www.ti.com High-Performance , 24 Bit, 216 kHz Sampling, Stereo Audi o Analog-to-Digital Converter Check for Samples: PCM4202-EP SGLS388 – JUNE 2007 FEATURES 1 •2 Controlled Baseli ne – One Assembly/Test Site, One Fabr ication Site • Extended Temperature P erformance of –40°C to 85°C • Enh anced Diminishing Manufacturing Sources (DMS) Support • Enhanced Product-Cha nge Notification • Qualification Pedi gree Component qualification in accorda nce with JEDEC and industry standards t o ensure reliable operation over an ext ended temperature range. This includes, but is not limited to, Highly Accelera ted Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbias ed HAST, electromigration, bond interme tallic life, and mold compound life. Su ch qualification testing should not be viewed as justifying use of this compon ent beyond specified performance and en vironmental limits. • Two High-Perfor mance, Delta-Sigma Analog-to-Digital Converters – 24 Bit Linear PCM or 1 Bit Direct.

Keywords: PCM4202-EP, datasheet, pdf, etcTI, Analog-to-Digital, Converter, stock, pinout, distributor, price, schematic, inventory, databook, Electronic, Components, Parameters, parts, cross reference, chip, Semiconductor, circuit, Electric, manual, substitute, Equivalent

PCM4202-EP
www.ti.com
High-Performance, 24 Bit, 216 kHz Sampling, Stereo Audio
Analog-to-Digital Converter
Check for Samples: PCM4202-EP
SGLS388 JUNE 2007
FEATURES
1
2 Controlled Baseline
One Assembly/Test Site, One Fabrication
Site
Extended Temperature Performance of 40°C
to 85°C
Enhanced Diminishing Manufacturing Sources
(DMS) Support
Enhanced Product-Change Notification
Qualification Pedigree
Component qualification in accordance with JEDEC and industry
standards to ensure reliable operation over an extended
temperature range. This includes, but is not limited to, Highly
Accelerated Stress Test (HAST) or biased 85/85, temperature
cycle, autoclave or unbiased HAST, electromigration, bond
intermetallic life, and mold compound life. Such qualification testing
should not be viewed as justifying use of this component beyond
specified
performance and environmental limits.
Two High-Performance, Delta-Sigma
Analog-to-Digital Converters
24 Bit Linear PCM or 1 Bit Direct Stream
Digital (DSD) Output Data
Supports PCM Output Sampling Rates up
to 216 kHz
Supports 64 fS and 128 fS DSD Output Data
Rates
Dynamic Performance: PCM Output
Dynamic Range (VIN = 60 dBFS, fIN = 1 kHz,
A-Weighted): 118 dB
THD+N (VIN = 0.5 dB, fIN = 1 kHz): 105 dB
Dynamic Performance: DSD Output, 64 fS
Dynamic Range (A-Weighted): 115 dB
THD+N (VIN = 0.5 dB, fIN = 1 kHz): 102 dB
Audio Serial Port
24 Bit Linear PCM Output Data
Master or Slave Mode Operation
Supports Left-Justified, Right-Justified, and
I2S® Data Formats
Additional PCM Output Features:
Linear-Phase Digital Decimation Filter
Digital High-Pass Filter for DC Removal
Clipping Flag Output for Each Channel
Power Supplies: 5 V Analog and 3.3 V Digital
Power Dissipation:
fS = 48 kHz: 308 mW typical
fS = 96 kHz: 338 mW typical
fS = 192 kHz: 318 mW typical
Power-Down Mode
Available in a SSOP-28 Package
Pin- and Function-Compatible with the
PCM1804
APPLICATIONS
Digital Recorders and Mixing Desks
Digital Audio Effects Processors
Broadcast Studio Equipment
Surround-Sound Encoders
High-End A/V Receivers
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
I2S is a registered trademark of Royal Philips Electronics B.V., The Netherlands.
2
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2007, Texas Instruments Incorporated

                    
                    






Index : 0  1  2  3   4  5  6  7   8  9  A  B   C  D  E  F   G  H  I  J   K  L  M  N   O  P  Q  R   S  T  U  V   W  X  Y  Z
@ 2014 :: Datasheetspdf.com :: Semiconductors datasheet search & download site (Privacy Policy & Contact)