SN54ABT18245 Datasheet | SCAN TEST DEVICE





(Datasheet) SN54ABT18245 Datasheet PDF Download

Part Number SN54ABT18245
Description SCAN TEST DEVICE
Manufacture etcTI
Total Page 30 Pages
PDF Download Download SN54ABT18245 Datasheet PDF

Features: SN54ABT18245 SCAN TEST DEVICE WITH 18-BI T BUS TRANSCEIVERS SGBS307A – AUGUST 1994 – REVISED JANUARY 1995 • Mem ber of the Texas Instruments SCOPE ™ Family of Testability Products • Memb er of the Texas Instruments Widebus ™ Family • Compatible With the IEEE St andard 1149.1-1990 (JTAG) Test Access P ort and Boundary-Scan Architecture • SCOPE ™ Instruction Set – IEEE Stan dard 1149.1-1990 Required Instructions, CLAMP and HIGHZ – Parallel-Signature Analysis at Inputs – Pseudo-Random P attern Generation From Outputs – Samp le Inputs/Toggle Outputs – Binary Cou nt From Outputs – Device Identificati on – Even-Parity Opcodes • State-of -the-Art EPIC-ΙΙB™ BiCMOS Design Si gnificantly Reduces Power Dissipation Packaged in 380-mil Fine-Pitch Ceram ic Flat Packages Using 25-mil Center-to -Center Spacings description The SN54AB T18245 scan test device with 18-bit bus transceivers is a member of the Texas Instruments SCOPE™ testability integrated circuit family. This family of devices supports IEEE Standard.

Keywords: SN54ABT18245, datasheet, pdf, etcTI, SCAN, TEST, DEVICE, stock, pinout, distributor, price, schematic, inventory, databook, Electronic, Components, Parameters, parts, cross reference, chip, Semiconductor, circuit, Electric, manual, substitute, Equivalent

SN54ABT18245
SCAN TEST DEVICE WITH 18-BIT BUS TRANSCEIVERS
SGBS307A – AUGUST 1994 – REVISED JANUARY 1995
Member of the Texas Instruments SCOPE
Family of Testability Products
Member of the Texas Instruments
Widebus Family
Compatible With the IEEE Standard
1149.1-1990 (JTAG) Test Access Port and
Boundary-Scan Architecture
SCOPE Instruction Set
– IEEE Standard 1149.1-1990 Required
Instructions, CLAMP and HIGHZ
– Parallel-Signature Analysis at Inputs
– Pseudo-Random Pattern Generation
From Outputs
– Sample Inputs/Toggle Outputs
– Binary Count From Outputs
– Device Identification
– Even-Parity Opcodes
State-of-the-Art EPIC-ΙΙBBiCMOS Design
Significantly Reduces Power Dissipation
Packaged in 380-mil Fine-Pitch
Ceramic Flat Packages Using 25-mil
Center-to-Center Spacings
description
The SN54ABT18245 scan test device with 18-bit
bus transceivers is a member of the Texas
Instruments SCOPEtestability integrated circuit
family. This family of devices supports IEEE
Standard 1149.1-1990 boundary scan to facilitate
testing of complex circuit-board assemblies. Scan
access to the test circuitry is accomplished via the
4-wire test access port (TAP) interface.
SN54ABT18245 . . . WD PACKAGE
(TOP VIEW)
1DIR
1B1
1B2
GND
1B3
1B4
VCC
1B5
1B6
1B7
GND
1B8
1B9
2B1
2B2
2B3
2B4
GND
2B5
2B6
2B7
VCC
2B8
2B9
GND
2DIR
TDO
TMS
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
56 1OE
55 1A1
54 1A2
53 GND
52 1A3
51 1A4
50 VCC
49 1A5
48 1A6
47 1A7
46 GND
45 1A8
44 1A9
43 2A1
42 2A2
41 2A3
40 2A4
39 GND
38 2A5
37 2A6
36 2A7
35 VCC
34 2A8
33 2A9
32 GND
31 2OE
30 TDI
29 TCK
In the normal mode, this device contains 18-bit noninverting bus transceivers. It can be used either as two 9-bit
transceivers or one 18-bit transceiver. The test circuitry can be activated by the TAP to take snapshot samples
of the data appearing at the device pins or to perform a self test on the boundary-test cells. Activating the TAP
in the normal mode does not affect the functional operation of the SCOPEbus transceivers.
Data flow is controlled by the direction-control (DIR) and output-enable (OE) inputs. Data transmission is
allowed from the A bus to the B bus or from the B bus to the A bus depending upon the logic level at DIR. The
output-enable (OE) can be used to disable the device so that the buses are effectively isolated.
In the test mode, the normal operation of the SCOPEbus transceivers is inhibited and the test circuitry is
enabled to observe and control the I/O boundary of the device. When enabled, the test circuitry performs
boundary-scan test operations according to the protocol described in IEEE Standard 1149.1-1990.
SCOPE, Widebus, and EPIC-ΙΙB are trademarks of Texas Instruments Incorporated.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
Copyright © 1995, Texas Instruments Incorporated
1

                    
                    






Index : 0  1  2  3   4  5  6  7   8  9  A  B   C  D  E  F   G  H  I  J   K  L  M  N   O  P  Q  R   S  T  U  V   W  X  Y  Z
@ 2014 :: Datasheetspdf.com :: Semiconductors datasheet search & download site (Privacy Policy & Contact)