20 MSPS 3-CHANNEL ANALOG-TO-DIGITAL CONVERTER
WITH HIGH-PRECISION CLAMP
SLAS104A – JULY 1995 – REVISED NOVEMBER 1996
D 3-Channel CMOS ADC
D 5-V Single-Supply Operation or 5-V Analog
Supply with Digital Supply from
2.7 V to 5.25 V
D 8-Bit Resolution
D Differential Linearity Error . . . ± 0.5 LSB Max
D Linearity Error . . . ± 0.75 LSB Max
D Maximum Conversion Rate
20 Megasamples per Second
D Analog Input Voltage Range
2 VI(PP) Min
D 64-Pin Shrink QFP Package
D Analog Input Bandwidth . . . >14 MHz
D Suitable for YUV or RGB Applications
D Digital Clamp Optimized for NTSC or PAL
D High-Precision Clamp . . . ± 1 LSB
D Automatic Clamp Pulse Generator
D Output-Data Format Multiplexer
D Low Power Consumption
The TLC5733A is a 3-channel 8-bit semiflash analog-to-digital converter (ADC) that operates from a single 5-V
power supply. It converts a wide-band analog signal (such as a video signal) to digital data at sampling rates
up to 20 MSPS minimum. The TLC5733A contains a feed-back type high-precision clamp circuit for each ADC
channel for video (YUV) applications and a clamp pulse generator that detects COMPOSITE SYNC† pulses
automatically. A clamp pulse can also be supplied externally. The output-data format multiplexer selects a ratio
of Y:U:V of 4:4:4, 4:1:1, or 4:2:2. For RGB applications, the 4:4:4 output format without clamp function can be
used. The TLC5733A is characterized for operation from – 20°C to 75°C.
TA QUAD FLATPACK
– 20°C to 75°C
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
† COMPOSITE SYNC refers to the externally generated synchronizing signal that is a combination of vertical and horizontal sync information
used in display and TV systems.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
Copyright © 1996, Texas Instruments Incorporated
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