LM211-EP COMPARATOR Datasheet

LM211-EP Datasheet, PDF, Equivalent


Part Number

LM211-EP

Description

DIFFERENTIAL COMPARATOR

Manufacture

etcTI

Total Page 24 Pages
Datasheet
Download LM211-EP Datasheet


LM211-EP
www.ti.com
LM211-EP
DIFFERENTIAL COMPARATOR WITH STROBES
SLCS140A – DECEMBER 2002 – REVISED MAY 2006
FEATURES
Controlled Baseline
– One Assembly/Test Site, One Fabrication
Site
Extended Temperature Performance of
–55°C to 125°C
Enhanced Diminishing Manufacturing
Sources (DMS) Support
Enhanced Product Change Notification
Qualification Pedigree (1)
Fast Response Times
Strobe Capability
(1) Component qualification in accordance with JEDEC and
industry standards to ensure reliable operation over an
extended temperature range. This includes, but is not limited
to, Highly Accelerated Stress Test (HAST) or biased 85/85,
temperature cycle, autoclave or unbiased HAST,
electromigration, bond intermetallic life, and mold-compound
life. Such qualification testing should not be viewed as
justifying use of this component beyond specified
performance and environmental limits.
Maximum Input Bias Current . . . 300 nA
Maximum Input Offset Current . . . 70 nA
Can Operate From Single 5-V Supply
D PACKAGE
(TOP VIEW)
EMIT OUT
IN+
IN−
VCC−
1
2
3
4
8 VCC+
7 COL OUT
6 BAL/STRB
5 BALANCE
DESCRIPTION/ORDERING INFORMATION
The LM211-EP is a single high-speed voltage comparator. This device is designed to operate from a wide range
of power-supply voltages, including ±15-V supplies for operational amplifiers and 5-V supplies for logic systems.
The output levels are compatible with most TTL and MOS circuits. This comparator is capable of driving lamps
or relays and switching voltages up to 50 V at 50 mA. All inputs and outputs can be isolated from system
ground. The outputs can drive loads referenced to ground, VCC+ or VCC–. Offset balancing and strobe capabilities
are available, and the outputs can be wired-OR connected. If the strobe is low, the output is in the off state,
regardless of the differential input.
ORDERING INFORMATION
TA
–40°C to 125°C
–55°C to 125°C
VIO max
AT 25°C
3 mV
3 mV
PACKAGE (1)
SOIC – D
SOIC – D
Tape and reel
Tape and reel
ORDERABLE PART NUMBER
LM211QDREP
LM211MDREP
TOP-SIDE MARKING
LM211E
LM211M
(1) Package drawings, standard packing quantities, thermal data, symbolization, and PCB design guidelines are available at
www.ti.com/sc/package.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2002–2006, Texas Instruments Incorporated

LM211-EP
LM211-EP
DIFFERENTIAL COMPARATOR WITH STROBES
SLCS140A – DECEMBER 2002 – REVISED MAY 2006
FUNCTIONAL BLOCK DIAGRAM
BALANCE
BAL/STRB
IN+ +
COL OUT
IN− −
EMIT OUT
BAL/STRB BALANCE
450
450
SCHEMATIC
Component Count
Resistors
Diodes
EPI FET
Transistors
20
2
1
22
2.4 2.4
kk
70
1.2 k
750
600
www.ti.com
VCC+
IN+ 1.2 k
IN−
250
200
All resistor values shown are nominal.
4 k
400
60
450
2 k
130
600
COL OUT
4
EMIT OUT
VCC−
2 Submit Documentation Feedback


Features www.ti.com LM211-EP DIFFERENTIAL COMPAR ATOR WITH STROBES SLCS140A – DECEMBER 2002 – REVISED MAY 2006 FEATURES Controlled Baseline – One Assembly /Test Site, One Fabrication Site • Ex tended Temperature Performance of –55 °C to 125°C • Enhanced Diminishing Manufacturing Sources (DMS) Support • Enhanced Product Change Notification Qualification Pedigree (1) • Fast Response Times • Strobe Capability (1 ) Component qualification in accordance with JEDEC and industry standards to e nsure reliable operation over an extend ed temperature range. This includes, bu t is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, te mperature cycle, autoclave or unbiased HAST, electromigration, bond intermetal lic life, and mold-compound life. Such qualification testing should not be vie wed as justifying use of this component beyond specified performance and envir onmental limits. • Maximum Input Bia s Current . . . 300 nA • Maximum Input Offset Current . . . 70 nA • Can Operate From Sing.
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