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Part Number SN74LVC2G00W-EP
Manufacturers Texas Instruments
Logo Texas Instruments
Description DUAL 2-INPUT POSITIVE-NAND GATE
Datasheet SN74LVC2G00W-EP DatasheetSN74LVC2G00W-EP Datasheet (PDF)

  SN74LVC2G00W-EP   SN74LVC2G00W-EP
www.ti.com FEATURES • Controlled Baseline – One Assembly/Test Site, One Fabrication Site • Extended Temperature Performance of –55°C to 115°C • Enhanced Diminishing Manufacturing Sources (DMS) Support • Enhanced Product-Change Notification • Qualification Pedigree (1) • Supports 5-V VCC Operation • Inputs Accept Voltages to 5.5 V • Max tpd of 5.3 ns at 3.3 V • Low Power Consumption, 10-µA Max ICC (1) Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits. SN74LVC2G00W-EP DUAL 2-INPUT POSITIVE-NAND GATE SCES645 – SEPTEMBER 2005 • ±24-mA Output Drive at 3.3 V • Typic.



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