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TC4011BP

Toshiba
Part Number TC4011BP
Manufacturer Toshiba
Description Quad 2 Input NAND Gate
Published Apr 11, 2020
Detailed Description TC4011BP/BF/BFT TOSHIBA CMOS Digital Integrated Circuit Silicon Monolithic TC4011BP, TC4011BF, TC4011BFT TC4011B Quad 2 ...
Datasheet PDF File TC4011BP PDF File

TC4011BP
TC4011BP

Overview
TC4011BP/BF/BFT TOSHIBA CMOS Digital Integrated Circuit Silicon Monolithic TC4011BP, TC4011BF, TC4011BFT TC4011B Quad 2 Input NAND Gate The TC4011B is 2-input positive logic NAND gate respectively.
Since all the outputs of these gates are provided with the inverters as buffers, the input/output characteristics have been improved and the variation of propagation delay time due to the increase in load capacity is kept down to the minimum.
Pin Assignment TC4011BP A1 1 B1 2 X1 3 X2 4 B2 5 A2 6 VSS 7 (top view) Logic Diagram A B 14 VDD 13 A4 12 B4 11 X4 10 X3 9 B3 8 A3 X = A･B X TC4011BF TC4011BFT Weight DIP14-P-300-2.
54 SOP14-P-300-1.
27A TSSOP14-P-0044-0.
65A : 0.
96 g (typ.
) : 0.
18 g (typ.
) : 0.
06 g (typ.
) Start of commercial production 1978-06 1 2014-03-01 Absolute Maximum Ratings (Note) TC4011BP/BF/BFT Characteristics Symbol Rating Unit DC supply voltage Input voltage Output voltage DC input current Power dissipation Operating temperature range Storage temperature range VDD VIN VOUT IIN PD Topr Tstg VSS − 0.
5 to VSS + 20 VSS − 0.
5 to VDD + 0.
5 VSS − 0.
5 to VDD + 0.
5 ±10 300 (DIP)/180 (SOP) −40 to 85 −65 to 150 V V V mA mW °C °C Note: Exceeding any of the absolute maximum ratings, even briefly, lead to deterioration in IC performance or even destruction.
Using continuously under heavy loads (e.
g.
the application of high temperature/current/voltage and the significant change in temperature, etc.
) may cause this product to decrease in the reliability significantly even if the operating conditions (i.
e.
operating temperature/current/voltage, etc.
) are within the absolute maximum ratings and the operating ranges.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.
e.
reliability test report and estimated failure rate, etc).
Operating Ranges (VSS = 0 V) (Note) Characteristics Symbol Test Condition Min Typ...


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