D/A Converter. DAC7718 Datasheet

DAC7718 Converter. Datasheet pdf. Equivalent

Part DAC7718
Description Quad 12-Bit D/A Converter
Feature DAC7718 DAC7718 DAC7718 www.ti.com SBAS361A – MAY 2009 – REVISED DECEMBER 2009 Octal, 12-Bit, Lo.
Manufacture etcTI
Datasheet
Download DAC7718 Datasheet



DAC7718
DAC7718
DAC7718
DAC7718
www.ti.com
SBAS361A – MAY 2009 – REVISED DECEMBER 2009
Octal, 12-Bit, Low-Power, High-Voltage Output, Serial Input
DIGITAL-TO-ANALOG CONVERTER
Check for Samples: DAC7718
FEATURES
1
2345 Bipolar Output: ±2V to ±16.5V
• Unipolar Output: 0V to +33V
• 12-Bit Resolution
• Low Power: 14.4mW/Ch (Bipolar Supply)
• Relative Accuracy: 1 LSB Max
• Low Zero/Full-Scale Error: ±1 LSB Max
• Flexible System Calibration
• Low Glitch: 4nV-s
• Settling Time: 15ms
• Channel Monitor Output
• Programmable Gain: x4/x6
• Programmable Offset
• SPI™: Up to 50MHz, 1.8V/3V/5V Logic
• Schmitt Trigger Inputs
• Daisy-Chain with Sleep Mode Enhancement
• Packages: QFN-48 (7x7mm), TQFP-64
(10x10mm)
APPLICATIONS
• Automatic Test Equipment
• PLC and Industrial Process Control
• Communications
IOVDD DGND DVDD
AVDD
AVSS
REF-A
WAKEUP
SCLK
CS
SDI
SDO
RST
RSTSEL
LDAC
CLR
USB/BTC
GPIO-0
GPIO-1
GPIO-2
AIN-0
AIN-1
DAC7718
Reference
Buffer A
Command
Registers
To DAC-0, DAC-1,
DAC-2, DAC-3
(When Correction Engine Disabled)
OFFSET
DAC A
Analog Monitor
VOUT-0
VOUT-7
AIN-0
AIN-1
Ref Buffer A
Ref Buffer B
OFFSET-B
Input Data
Register 0
Correction
Engine
User Calibration:
Zero Register 0
Gain Regsiter 0
DAC-0
Data
DAC-0
Latch-0
LDAC
To DAC-0, DAC-1,
DAC-2, DAC-3
Internal Trimming
Zero/Gain; INL
To DAC-4, DAC-5, DAC-6, DAC-7
(Same Function Blocks
for All Channels)
Reference
Buffer B
OFFSET
DAC B
Power-Up/
Power-Down
Control
VMON
OFFSET-A
VOUT-0
AGND-A
OFFSET-B
AGND-B
VOUT-7
DGND DVDD
AVDD
AVSS
REF-B
DESCRIPTION
The DAC7718 is a low-power, octal, 12-bit
digital-to-analog converter (DAC). With a 5V
reference, the output can either be a bipolar ±15V
voltage when operating from dual ±15.5V (or higher)
power supplies, or a unipolar 0V to +30V voltage
when operating from a +30.5V (or higher) power
supply. With a 5.5V reference, the output can either
be a bipolar ±16.5V voltage when operating from dual
±17V (or higher) power supplies, or a unipolar 0V to
+33V voltage when operating from a +33.5V (or
higher) power supply. This DAC provides low-power
operation, good linearity, and low glitch over the
specified temperature range of –40°C to +105°C. This
device is trimmed in manufacturing and has very low
zero-code and gain error. In addition, system level
calibration can be performed over the entire signal
chain. The output range can be offset by using the
DAC offset register.
The DAC7718 features a standard, high-speed serial
peripheral interface (SPI) that operates at up to
50MHz and is 1.8V, 3V, and 5V logic compatible, to
communicate with a DSP or microprocessor. The
input data of the device are double-buffered. An
asynchronous load input (LDAC) transfers data from
the DAC data register to the DAC latch. The
asynchronous CLR input sets the output of all eight
DACs to AGND. The VMON pin is a monitor output
that connects to the individual analog outputs, the
offset DAC, the reference buffer outputs, and two
external inputs through a multiplexer (mux).
The DAC7718 is pin-to-pin and function-compatible
with the DAC8718 (16-bit) and the DAC8218 (14-bit).
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
DSP is a trademark of Texas Instruments.
2
SPI, QSPI are trademarks of Motorola Inc.
3
Microwire is a trademark of National Semiconductor.
4
All other trademarks are the property of their respective owners.
5
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2009, Texas Instruments Incorporated



DAC7718
DAC7718
SBAS361A – MAY 2009 – REVISED DECEMBER 2009
www.ti.com
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
PRODUCT
DAC7718
RELATIVE
ACCURACY
(LSB)
±1
±1
ORDERING INFORMATION(1)
DIFFERENTIAL
LINEARITY
(LSB)
PACKAGE-
LEAD
PACKAGE
DESIGNATOR
±1
QFN-48
RGZ
±1
TQFP-64
PAG
SPECIFIED
TEMPERATURE
RANGE
–40°C to +105°C
–40°C to +105°C
PACKAGE
MARKING
DAC7718
DAC7718
(1) For the most current package and ordering information, see the Package Option Addendum at the end of this data sheet, or see the TI
web site at www.ti.com.
ABSOLUTE MAXIMUM RATINGS(1)
Over operating free-air temperature range (unless otherwise noted).
AVDD to AVSS
AVDD to AGND
AVSS to AGND, DGND
DVDD to DGND
IOVDD to DGND
AGND-x to DGND
Digital input voltage to DGND
SDO to DGND
VOUT-x, VMON, AIN-x to AVSS
REF-A, REF-B to AGND
GPIO-n to DGND
GPIO-n input current
Maximum current from VMON
Operating temperature range
Storage temperature range
Maximum junction temperature (TJ max)
Human body model (HBM)
ESD ratings
Charged device model (CDM)
Machine model (MM)
Thermal impedance
Junction-to-ambient, qJA
Junction-to-case, qJC
TQFP
QFN
TQFP
QFN
Power dissipation
DAC7718
–0.3 to 38
–0.3 to 38
–19 to 0.3
–0.3 to 6
–0.3 to min of (6 or DVDD + 0.3)
–0.3 to 0.3
–0.3 to IOVDD + 0.3
–0.3 to IOVDD + 0.3
–0.3 to AVDD + 0.3
–0.3 to DVDD
–0.3 to IOVDD + 0.3
5
3
–40 to +105
–65 to +150
+150
2.5
1000
200
55
27.5
21
10.8
(TJ max – TA) / qJA
UNIT
V
V
V
V
V
V
V
V
V
V
V
mA
mA
°C
°C
°C
kV
V
V
°C/W
°C/W
°C/W
°C/W
W
(1) Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. Exposure to absolute
maximum conditions for extended periods may affect device reliability.
2
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Copyright © 2009, Texas Instruments Incorporated







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