DIGITAL-TO-ANALOG CONVERTER. DAC7822 Datasheet

DAC7822 CONVERTER. Datasheet pdf. Equivalent

Part DAC7822
Description DIGITAL-TO-ANALOG CONVERTER
Feature BurrĆBrown Products from Texas Instruments DAC7822 DAC7822 SBAS374A – JUNE 2006 – REVISED JULY 20.
Manufacture Burr-Brown
Datasheet
Download DAC7822 Datasheet




DAC7822
BurrĆBrown Products
from Texas Instruments
DAC7822
DAC7822
SBAS374A – JUNE 2006 – REVISED JULY 2007
Dual, 12-Bit, Parallel Input, Multiplying
Digital-to-Analog Converter
FEATURES
• ±1LSB INL
2.5V to 5.5V Supply Operation
Fast Parallel Interface:
17ns Write Cycle
Update Rate of 20.4MSPS
10MHz Multiplying Bandwidth
• ±15V Reference Input
Extended Temperature Range:
–40°C to +125°C
40-Lead QFN
12-Bit Monotonic
4-Quadrant Multiplication
Power-On Reset with Brownout Detection
Readback Function
Industry-Standard Pin Configuration
Pin-Compatible with the AD5405
APPLICATIONS
Portable Battery-Powered Instruments
Waveform Generators
Analog Processing
Programmable Amplifiers and Attenuators
Digitally-Controlled Calibration
Programmable Filters and Oscillators
Ultrasound
DESCRIPTION
The DAC7822 is a dual, CMOS, 12-bit, current
output digital-to-analog converter (DAC). This device
operates from a 2.5V to 5.5V power supply, making it
suitable for battery-powered and many other
applications.
The DAC7822 operates with a fast parallel interface.
Data readback allows the user to read the contents
of the DAC register via the DB pins. On power-up,
the internal register and latches are filled with zeroes
and the DAC outputs are at zero scale.
The DAC7822 offers excellent 4-quadrant
multiplication characteristics, with large signal
multiplying bandwidth of 10MHz. The applied
external reference input voltage (VREF) determines
the full-scale output current. An integrated feedback
resistor (RFB) provides temperature tracking and
full-scale voltage output when combined with an
external current-to-voltage precision amplifier. The
DAC7822 also includes the resistors necessary for
4-quadrant multiplication and other configuration
modes.
The DAC7822 is available in a 40-lead QFN
package.
DATA
INPUTS
VDD
DB0
DB11
R3A R2_3A R2A VREFA R1A
R3
R2
2R
2R
R1
RFB
2R
2R
INPUT
BUFFER
LATCH
12-Bit
R-2R DAC A
RFBA
IOUT1A
IOUT2A
DAC A/B
CS
R/W
LDAC
CLR
GND
CONTROL
LOGIC
LATCH
POWER-ON
RESET
R3
R2
2R
2R
12-Bit
R-2R DAC B
R1
RFB
2R
2R
IOUT1B
IOUT2B
RFBB
R3B R2_3B R2B VREFB R1B
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
All trademarks are the property of their respective owners.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2006–2007, Texas Instruments Incorporated



DAC7822
DAC7822
SBAS374A – JUNE 2006 – REVISED JULY 2007
www.ti.com
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be
more susceptible to damage because very small parametric changes could cause the device not to meet its published
specifications.
PACKAGE/ORDERING INFORMATION
For the most current package and ordering information, see the Package Option Addendum at the end of this
document, or see the TI website at www.ti.com.
ABSOLUTE MAXIMUM RATINGS(1)
Over operating free-air temperature range (unless otherwise noted).
VDD to GND
Digital input voltage to GND
VOUT to GND
Operating temperature range
Storage temperature range
Junction temperature (TJ max)
ESD Rating, HBM
ESD Rating, CDM
DAC7822
–0.3 to +7.0
–0.3 to VDD + 0.3
–0.3 to VDD + 0.3
–40 to +125
–65 to +150
+150
2000
1000
UNIT
V
V
V
°C
°C
°C
V
V
(1) Stresses above those listed under absolute maximum ratings may cause permanent damage to the device. Exposure to absolute
maximum conditions for extended periods may affect device reliability.
2
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