SN54BCT8244A, SN74BCT8244A
SCAN TEST DEVICES
WITH OCTAL BUFFERS
SCBS042E − FEBRUARY 1990 − REVISED JULY 1996
D Members of the Texas Instruments
SCOPE™ Family of Testability Products
D Octal Test-Integrated Circuits D Functionally Equivalent to ’F244 and
’BCT244 in the Normal-Function Mode
D Compatible With the IEEE Standard
1149.1-1990 (JTAG) Test Access Po...
