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SN54BCT8244A Datasheet, Equivalent, SCAN TESTER.

SCAN TESTER

SCAN TESTER

 

 

 

Part SN54BCT8244A
Description SCAN TESTER
Feature SN54BCT8244A, SN74BCT8244A SCAN TEST DEV ICES WITH OCTAL BUFFERS SCBS042E − FE BRUARY 1990 − REVISED JULY 1996 D Me mbers of the Texas Instruments SCOPE™ Family of Testability Products D Octal Test-Integrated Circuits D Functionall y Equivalent to ’F244 and ’BCT244 i n the Normal-Function Mode D Compatible With the IEEE Standard 1149.
1-1990 (JT AG) Test Access Port and Boundary-Scan Architecture D Test Operation Synchrono us to Test Access Port (TAP) D Implemen t Optional Test Reset Signal by Recogni zing a Double-High-Level Voltage (10 V ) on TMS Pin D SCOPE™ Instruction Set − IEEE Standard 1149.
1-19 .
Manufacture Texas Instruments
Datasheet
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Part SN54BCT8244A
Description SCAN TESTER
Feature SN54BCT8244A, SN74BCT8244A SCAN TEST DEV ICES WITH OCTAL BUFFERS SCBS042E − FE BRUARY 1990 − REVISED JULY 1996 D Me mbers of the Texas Instruments SCOPE™ Family of Testability Products D Octal Test-Integrated Circuits D Functionall y Equivalent to ’F244 and ’BCT244 i n the Normal-Function Mode D Compatible With the IEEE Standard 1149.
1-1990 (JT AG) Test Access Port and Boundary-Scan Architecture D Test Operation Synchrono us to Test Access Port (TAP) D Implemen t Optional Test Reset Signal by Recogni zing a Double-High-Level Voltage (10 V ) on TMS Pin D SCOPE™ Instruction Set − IEEE Standard 1149.
1-19 .
Manufacture Texas Instruments
Datasheet
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SN54BCT8244A

SN54BCT8244A
SN54BCT8244A

SN54BCT8244A

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