SN54ABT18640, SN74ABT18640
SCAN TEST DEVICES WITH 18-BIT INVERTING BUS TRANSCEIVERS
SCBS267C – FEBRUARY 1994 – REVISED JULY 1996
D Members of the Texas Instruments
SCOPE ™ Family of Testability Products
D Members of the Texas Instruments
Widebus™ Family
D Compatible With the IEEE Standard
1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture
D ...
