Operational Amplifier. HS7-2510RH-Q Datasheet

HS7-2510RH-Q Amplifier. Datasheet pdf. Equivalent

Part HS7-2510RH-Q
Description Radiation Hardened High Slew Rate Operational Amplifier
Feature HS-2510RH Data Sheet August 1999 File Number 3592.2 Radiation Hardened High Slew Rate Operational A.
Manufacture Intersil Corporation
Datasheet
Download HS7-2510RH-Q Datasheet




HS7-2510RH-Q
Data Sheet
HS-2510RH
August 1999 File Number 3592.2
Radiation Hardened High Slew Rate
Operational Amplifier
The HS-2510RH is a radiation hardened high performance
operational amplifier which set the standard for maximum
slew rate and wide bandwidth operation in moderately
powered, internally compensated, monolithic devices. In
addition to excellent dynamic characteristics, this
dielectrically isolated amplifier also offers low offset current
and high input impedance.
The ±50V/ms minimum slew rate and fast settling time of the
HS-2510RH are ideally suited for high speed D/A, A/D, and
pulse amplification designs. The HS-2510RH superior
bandwidth and 750kHz minimum full power bandwidth are
extremely useful in RF and video applications. To insure
compliance with slew rate and transient response
specifications, all devices are 100% tested for AC
performance characteristics over full temperature limits. To
improve signal conditioning accuracy, the HS-2510RH
provides a maximum offset current of 25nA and a minimum
input impedance of 50M, both at 25oC, as well as offset
voltage trim capability.
Specifications for Rad Hard QML devices are controlled
by the Defense Supply Center in Columbus (DSCC). The
SMD numbers listed here must be used when ordering.
Detailed Electrical Specifications for these devices are
contained in SMD 5962-95686. A “hot-link” is provided
on our homepage for downloading.
www.intersil.com/spacedefense/space.asp
Pinouts
HS-2510RH GDIP1-T8 (CERDIP)
OR
HS-2510RH CDIP2-T8 (SBDIP)
TOP VIEW
BAL 1
IN- 2
IN+ 3
V- 4
-
+
8 COMP
7 V+
6 OUT
5 BAL
Features
• Electrically Screened to SMD # 5962-95686
• QML Qualified per MIL-PRF-38535 Requirements
• High Slew Rate. . . . . . . . . . . . 50V/µs (Min), 65V/µs (Typ)
• Wide Power Bandwidth . . . . . . . . . . . . . . . . 750kHz (Min)
• Low Offset Current . . . . . . . . . . . . 25nA (Min), 10nA (Typ)
• High Input Impedance . . . . . . . 50M(Min), 100M(Typ)
• Wide Small Signal Bandwidth . . . . . . . . . . . .12MHz (Typ)
• Fast Settling Time (0.1% of 10V Step) . . . . . . 250ns (Typ)
• Low Quiescent Supply Current. . . . . . . . . . . . . 6mA (Max)
• Internally Compensated For Unity Gain Stability
• Total Gamma Dose. . . . . . . . . . . . . . . . . . . . . 10kRAD(Si)
Applications
• Data Acquisition Systems
• RF Amplifiers
• Video Amplifiers
• Signal Generators
• Pulse Amplification
Ordering Information
ORDERING NUMBER
INTERNAL
MKT. NUMBER
5962D9568601VPA
HS7-2510RH-Q
5962D9568601VPC
HS7B-2510RH-Q
5962D9568601VXC
HS9-2510RH-Q
TEMP. RANGE
(oC)
-55 to 125
-55 to 125
-55 to 125
HS-2510RH
CDFP3-F14 (FLATPACK)
TOP VIEW
NC 1
COMP 2
BAL 3
IN- 4
IN+ 5
NC 6
NC 7
-
+
14 NC
13 V+
12 OUT
11 BAL
10 V-
9 NC
8 NC
1 CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.
www.intersil.com or 407-727-9207 | Copyright © Intersil Corporation 1999



HS7-2510RH-Q
Test Circuit
HS-2510RH
100K
1 OPEN
2 S3A
S1 1
OPEN 2
S2 1
OPEN 2
100K 2 S3B
+VCC
0.1 1
2
1 S5A
1 S6
2
S7 OPEN
31
BAL 2
ADJ
-2
DUT
+
S5B 1
OPEN
1
2K
50pF (NOTE 1)
500K
OPEN
S8
3
1
2
S9
2
V2
-1/10
ACOUT
V1
FOR LOOP STABILITY,
USE MIN VALUE CAPACITOR
TO PREVENT OSCILLATION
50K
-1
-
+
-
+
BUFFER
100
1
OPEN
100
VAC
1K
0.1 1
-VEE
2K
5K 2
S4
50K 1
10K
x2 EOUT
ALL RESISTORS = ±1% ()
ALL CAPACITORS = ±10% (µF)
NOTE:
1. Includes stray capacitances.
FIGURE 1. SIMPLIFIED TEST CIRCUIT
Test Circuit and Waveforms
+15V
INPUT
1K
+-
OUTPUT
2K 50pF
-15V
FIGURE 2. SIMPLIFIED TEST CIRCUIT
+5V
INPUT
-5V
+5V
OUTPUT
-5V
90%
10%
V
SLEW
RATE
T = V/T
+200mV
INPUT
0V
OVERSHOOT
90%
OUTPUT
10%
RISE TIME
0V
-200mV
NOTE: Measured on both positive and negative transitions.
Capacitance at Compensation pin should be minimized.
FIGURE 3. SLEW RATE WAVEFORM
NOTE: Measured on both positive and negative transitions.
Capacitance at Compensation pin should be minimized.
FIGURE 4. TRANSIENT RESPONSE WAVEFORM
2







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