ANALOG-TO-DIGITAL CONVERTER. ADS8504 Datasheet

ADS8504 CONVERTER. Datasheet pdf. Equivalent

ADS8504 Datasheet
Recommendation ADS8504 Datasheet
Part ADS8504
Description SAMPLING CMOS ANALOG-TO-DIGITAL CONVERTER
Feature ADS8504; www.DataSheet4U.com BurrĆBrown Products from Texas Instruments ADS8504 SLAS434 – JUNE 2005 12-BIT.
Manufacture Burr-Brown
Datasheet
Download ADS8504 Datasheet




Burr-Brown ADS8504
www.DataSheet4U.com
BurrĆBrown Products
from Texas Instruments
ADS8504
SLAS434 – JUNE 2005
12-BIT 250-KSPS SAMPLING CMOS ANALOG-TO-DIGITAL CONVERTER
FEATURES
250-kHz Sampling Rate
Standard ±10-V Input Range
73-dB SINAD With 45-kHz Input
±0.45 LSB Max INL
±0.45 LSB Max DNL
12 Bit No Missing Code
±1 LSB Bipolar Zero Errors
±0.4 PPM/°C Bipolar Zero Error Drift
Single 5-V Supply Operation
Pin-Compatible With ADS7804/05 (Low Speed)
and 16-Bit ADS8505
Uses Internal or External Reference
Full Parallel Data Output
70-mW Typ Power Dissipation at 250 KSPS
28-Pin SOIC Package
APPLICATIONS
Industrial Process Control
Data Acquisition Systems
Digital Signal Processing
Medical Equipment
Instrumentation
DESCRIPTION
The ADS8504 is a complete 12-bit sampling A/D
converter using state-of-the-art CMOS structures. It
contains a complete 12-bit, capacitor-based, SAR
A/D with S/H, reference, clock, interface for
microprocessor use, and 3-state output drivers.
The ADS8504 is specified at a 250-kHz sampling rate
over the full temperature range. Precision resistors
provide an industry standard ±10-V input range, while
the innovative design allows operation from a single
+5-V supply, with power dissipation under 100 mW.
The ADS8504 is available in a 28-pin SOIC package
and is fully specified for operation over the industrial
-40°C to 85°C temperature range.
Clock
Successive Approximation Register and Control Logic
R/C
CS
BYTE
BUSY
9.8 k
± 10 V Input
5 k
CAP
2 k
REF
CDAC
Buffer
4 k
Internal
+2.5 V Ref
Comparator
Output
Latches
and
Three
State
Drivers
Three
State
Parallel
Data
Bus
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2005, Texas Instruments Incorporated



Burr-Brown ADS8504
ADS8504
SLAS434 – JUNE 2005
PACKAGE/ORDERING INFORMATION(1)
www.ti.com
PRODUCT
MINIMUM
RELATIVE
ACCURACY
(LSB)
NO MISS-
ING CODE
ADS8504IB
±0.45
12
MINIMUM
SINAD
(dB)
72
SPECIFICATION
TEMPERATURE
RANGE
-40°C to 85°C
PACKAGE PACKAGE
LEAD
DESIGNATOR
SO-28
DW
ORDERING
NUMBER
TRANSPORT
MEDIA, QTY
ADS8504IBDW Tube, 20
ADS8504IBDWR Tape and Reel, 1000
(1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI
web site at www.ti.com.
ABSOLUTE MAXIMUM RATINGS(1)
over operating free-air temperature range (unless otherwise noted)(2)
Analog inputs
VIN
CAP
REF
Ground voltage differences DGND, AGND1, AGND2
Digital inputs
VANA
VDIG to VANA
VDIG
Maximum junction temperature
Internal power dissipation
Lead temperature (soldering, 1,6mm from case, 10 seconds)
ADS8504
±25V
+VANA + 0.3 V to AGND2 - 0.3 V
Indefinite short to AGND2, momentary short to VANA
±0.3 V
6V
0.3 V
6V
-0.3 V to +VDIG + 0.3 V
165°C
825 mW
260°C
(1) Stresses beyond those listed under "absolute maximum ratings" may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under "recommended operating
conditions" is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2) All voltage values are with respect to network ground terminal.
ELECTRICAL CHARACTERISTICS
TA = -40°C to 85°C, fs = 250 kHz, VDIG = VANA = 5 V, using internal reference (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN TYP
Resolution
ANALOG INPUT
Voltage range
±10
Impedance
11.5
Capacitance
50
THROUGHPUT SPEED
Conversion cycle
Acquire and convert
Throughput rate
250
DC ACCURACY
INL Integral linearity error
-0.45
DNL
Differentiall linearity error
-0.45
No missing codes
12
Transition noise(2)
0.1
Full-scale error(3)(4)
Int. Ref.
-0.25
Full-scale error drift
Int. Ref.
±7
MAX
12
UNIT
Bits
V
k
pF
4 µs
kHz
0.45
0.45
0.25
LSB (1)
LSB (1)
Bits
LSB
%FSR
ppm/°C
(1) LSB means least significant bit. For the 12-bit, ±10-V input ADS8504, one LSB is 4.88 mV.
(2) Typical rms noise at worst case transitions and temperatures.
(3) As measured with fixed resistors shown in Figure 23. Adjustable to zero with external potentiometer.
(4) Full-scale error is the worst case of -full-scale or +full-scale deviation from ideal first and last code transitions, divided by the transition
voltage (not divided by the full-scale range) and includes the effect of offset error.
2



Burr-Brown ADS8504
ADS8504
www.ti.com
SLAS434 – JUNE 2005
ELECTRICAL CHARACTERISTICS (continued)
TA = -40°C to 85°C, fs = 250 kHz, VDIG = VANA = 5 V, using internal reference (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN TYP
MAX
Full-scale error(3)(4)
Ext. 2.5-V Ref.
-0.25
0.25
Full-scale error drift
Ext. 2.5-V Ref.
±2
Bipolar zero error(3)
-1 1
Bipolar zero error drift
±0.4
Power supply sensitivity
(VDIG = VANA = VD)
AC ACCURACY
+4.75 V < VD < +5.25 V
-0.5
0.5
SFDR
THD
SINAD
Spurious-free dynamic range
Total harmonic distortion
Signal-to-(noise+distortion)
fI = 45 kHz
fI = 45 kHz
fI = 45 kHz
–60-dB Input
86 94
-95
72 73
32
-86
SNR
Signal-to-noise ratio
Full-power bandwidth(6)
fI = 45 kHz
72 73
500
SAMPLING DYNAMICS
Aperture delay
5
Transient response
FS Step
2
Overvoltage recovery(7)
150
REFERENCE
Internal reference voltage
2.48 2.5
2.52
Internal reference source current (must use
external buffer)
1
Internal reference drift
8
External reference voltage range for specified
linearity
2.3 2.5
2.7
External reference current drain
Ext. 2.5-V Ref.
100
DIGITAL INPUTS
Logic levels
VIL Low-level input voltage
VIH High-level input voltage
IIL Low-level input current
IIH High-level input current
DIGITAL OUTPUTS
-0.3 0.8
2.0 VDIG +0.3 V
±10
±10
Data format (Parallel 12-bits)
Data coding (Binary 2's complement)
VOL Low-level output voltage
VOH High-level output voltage
Leakage current
Output capacitance
ISINK = 1.6 mA
ISOURCE = 500 µA
Hi-Z state, VOUT = 0 V to VDIG
Hi-Z state
4
0.4
±5
15
DIGITAL TIMING
Bus access timing
83
Bus relinquish timing
83
UNIT
%FSR
ppm/°C
LSB
ppm/°C
LSB
dB (5)
dB
dB
dB
dB
kHz
ns
µs
ns
V
µA
ppm/°C
V
µA
V
V
µA
µA
V
V
µA
pF
ns
ns
(5) All specifications in dB are referred to a full-scale ±10-V input.
(6) Full-power bandwidth is defined as the full-scale input frequency at which signal-to-(noise + distortion) degrades to 60 dB, or 10 bits of
accuracy.
(7) Recovers to specified performance after 2 x FS input overvoltage.
3







@ 2014 :: Datasheetspdf.com :: Semiconductors datasheet search & download site (Privacy Policy & Contact)