GET-30569 Test Results Datasheet

GET-30569 Datasheet, PDF, Equivalent


Part Number

GET-30569

Description

Qualification Test Results

Manufacture

CEL

Total Page 8 Pages
Datasheet
Download GET-30569 Datasheet


GET-30569
www.DataSheet4U.com

GET-30569
This report presents
the qual ification
test results-on-NE272
-1- .Test
Device
NE272
AI GaAs /In
GaAs hetero-junction
-
FEr
series.
2.Qualification
tests
A serres
of Qual ification
tests
consists
of following
rierns
l)High temperature
2)High temperature
The test
The test
conditions
parameters
DC Bias Test ( H T p T )
Reverse Bias Test ( H T R B T )
and sample size are shown in Table 1.
were measured before and after the tests.
bk~t Resu lli
The summary of qual ification
test result
is presented
in Table 3-1,3-2.
l)High Temperature
The followingfcondition
DC Bias Test
has been adopted:
VDs=2V ID=10mA T ch= 175°C
The test results
are shown in Table 3-1 and Fig.1 (1)-Fig.1(8)
The test elapsed for 5000 hours under the above condition.
The changes of all parameters
are withjn the delta crilteria.
2)High temperature
DC Bias Test
The following
condition
has been adopted:
VGDS=. '4V
T ch= 150°C
The test
results
are shown in Table 3-2 and Fig.2(1)-F:jg.2(8).
The test
elapsed
for 5000 hours under the above condition.
The changes
of all parameters
are within
the delta
criteria.
4.Conclusion
From the series
of qual ification
test results
described
above
t is concluded
that:
l)There is no degradation
DC bias test.
2) There is no degradation
Reverse bias test.
UP to 5000 hours at Tch=l75°C in High temperature
UP to 5000 hours at Tch=lSO°C in High temperature
NE272 is qua fied
for high
rei iabi
ity appl ications.
2/8


Features www.DataSheet4U.com This report prese nts the qual ification test result s-on-NE272 series. 2/8 1.Test -- De vice NE272 AI GaAs /In GaAs hetero-jun ction FEr 2.Qualification A serres of tests Qual ification tests consists of following rierns l)High 2)High The Th e test test temperature temperature co nditions parameters DC Bias Reverse an d were Test Bias ( H T p T ) Test are before ( H T R B T ) shown and in aft er Table the 1. tests. sample size m easured bk~t Resu lli The l)High Th e summary of qual ification DC Bias test Test has been result is prese nted in Table 3-1,3-2. Temperature followingfcondition ID=10mA adopted: VDs=2V The The The test test T ch= 175 °C results elapsed of all are for s hown 5000 in hours Table under are 3 -1 the and Fig.1 (1)-Fig.1(8) condit ion. crilteria. above the delta chang es parameters withjn 2)High The tem perature following '4V results elapsed of all DC Bias condition Test has been adopted: VGDS=. T ch=.
Keywords GET-30569, datasheet, pdf, CEL, Qualification, Test, Results, ET-30569, T-30569, -30569, GET-3056, GET-305, GET-30, Equivalent, stock, pinout, distributor, price, schematic, inventory, databook, Electronic, Components, Parameters, parts, cross reference, chip, Semiconductor, circuit, Electric, manual, substitute




@ 2014 :: Datasheetspdf.com :: Semiconductors datasheet search & download site (Privacy Policy & Contact)