SCAN TEST DEVICES
Description
SN54ABT8646, SN74ABT8646 SCAN TEST DEVICES WITH
OCTAL BUS TRANSCEIVERS AND REGISTERS SCBS123F − AUGUST 1992 − REVISED APRIL 2004
D Members of the Texas Instruments
SCOPE Family of Testability Products
D Compatible With the IEEE Standard
1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture
D Functionally Equivalent to ’F646 and
’ABT646 in the...
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