SCAN TEST DEVICE
Description
Members of the Texas Instruments
SCOPE ™ Family of Testability Products
Members of the Texas Instruments
Widebus ™ Family
Compatible With the IEEE Standard
1149.1-1990 (JTAG) Test Access Port and
Boundary-Scan Architecture
UBT ™ (Universal Bus Transceiver)
Combines D-Type Latches and D-Type
Flip-Flops for Operation in Transparent,
Latched, or Clocked...
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