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TC75S59FU

Toshiba
Part Number TC75S59FU
Manufacturer Toshiba
Description Single Comparator
Published Apr 23, 2005
Detailed Description TC75S59F/FU TOSHIBA CMOS Linear Integrated Circuit Silicon Monolithic TC75S59F, TC75S59FU Single Comparator The TC75S59...
Datasheet PDF File TC75S59FU PDF File

TC75S59FU
TC75S59FU

Overview
TC75S59F/FU TOSHIBA CMOS Linear Integrated Circuit Silicon Monolithic TC75S59F, TC75S59FU Single Comparator The TC75S59F/TC75S59FU is a CMOS general-purpose single comparator.
The device can operate off a single power supply and draws a lower supply current than a conventional bipolar general-purpose comparator.
This device’s open-drain output stage can be wire-ORed with those of other open-drain output circuits.
TC75S59F Features • Low-current power supply : IDD = 100 μA (typ.
) • Single power supply operation : VDD = ±0.
9 to ±3.
5 V or 1.
8 to 7 V • Wide common mode input voltage range : VSS to VDD − 0.
9 V • Open drain output circuit • Low input bias current • Small package TC75S59FU (SMV) (USV) Weight SSOP5-P-0.
95 : 0.
014 g (typ.
) SSOP5-P-0.
65A : 0.
006 g (typ.
) Marking (top view) 5 4 TF 1 2 3 Pin Connection (top view) VDD 5 OUT 4 1 2 3 IN (−) VSS IN (+) © 2019 1 Toshiba Electronic Devices & Storage Corporation Start of commercial production 1997-02 2019-09-11 Absolute Maximum Ratings (Ta = 25°C) TC75S59F/FU Characteristics Symbol Rating Unit Supply voltage Differential input voltage Input voltage Output current Power dissipation Operating temperature Storage temperature VDD, VSS ±3.
5 or 7 V DVIN ±7 V VIN VSS to VDD V IO ±35 mA PD 200 mW Topr −40 to 85 °C Tstg −55 to 125 °C Note: Using continuously under heavy loads (e.
g.
the application of high temperature/current/voltage and the significant change in temperature, etc.
) may cause this product to decrease in the reliability significantly even if the operating conditions (i.
e.
operating temperature/current/voltage, etc.
) are within the absolute maximum ratings and the operating ranges.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.
e.
reliability test report and estimated failure rate, etc).
Note: This device’s CM...


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