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TB502-3X-520-XX

Part Number	TB502-3X-520-XX
Manufacturer	PhaseLink Corporation
Description	Test Board
Published	Mar 25, 2010
Detailed Description	TB502-3x-520-xx www.DataSheet4U.com Test Board for chip evaluation and Layout recommendations A generic test board for ...
Datasheet	TB502-3X-520-XX PDF File

Overview

TB502-3x-520-xx www.
DataSheet4U.
com Test Board for chip evaluation and Layout recommendations A generic test board for the PLL502-3x and PLL520-0x/-1x/-2x/-3x/-4x/-7x In order to provide an example of recommended layout for PLL502-3x and PLL520-xx products, PhaseLink provides a generic test board for these parts.
Test boards are available for both TSSOP and SOIC 16 pin components.
In addition, the test board is designed to simplify the testing of the PLL502-3x and PLL520-xx parts.
It includes selection jumpers allowing the user to easily configure the selector pins (connecting them to GND or leaving them unconnected) as necessary.
Depending on the parts under evaluation, these selector pins allow the user to enable or disable the phase locked loop, or even select a multiplier value (see the datasheet of each part for details).
General Layout recommendations While this test board achieves satisfactory decoupling results, best results are achieved when the chip or die are laid out into the final PCB, following the recommendations indicated in the data sheet.
+3.
3V C1 C2 4.
7 uf 0.
1uf C3 0.
1uf C? R? R? 26 0.
01 uf R? CLKC 26 -10 db out Evaluation Chip U? 1 2 3 4 5 6 7 8 VDDA XIN XOUT S3 S2 OE VCON GNDA 502-38 CLKT Vcontrol R3 0 or 10 ohms C4 0.
1uf 26 0.
01 uf C? R? S0 S1 GND CLKC VDD CLKT GND GND 16 15 14 13 12 11 10 9 R1 50 35 Vin - PECL R2 50 Y1 CRYSTAL R? 26 -10 db out R? 35 S0 JP1 1 2 S1 JP2 1 2 S2 JP3 1 2 S3 JP4 1 2 Jumper Selections NOTE: 1.
2.
For PECL and PECL outputs: 50 Ω resistors (R1 and R2) should be installed.
For CMOS output: 50 Ω resistors (R1 and R2) should be removed.
In particular, it is essential to include decoupling (by-pass) capacitors as close to the chip as possible in order to minimize noise sensitivity from the power-supply and thus achieve best phase noise and jitter performance.
The generic test board provides positions for by-pass capacitors (C1, C2, C3) in order to decouple VDD and GND.
An additional by-pass capac...

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TB502-3X-520-XX Test Board - PhaseLink Corporation

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