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RN2902AFS

Toshiba
Part Number RN2902AFS
Manufacturer Toshiba
Description Silicon PNP Transistor
Published Nov 11, 2013
Detailed Description RN2901AFS~RN2906AFS TOSHIBA Transistor Silicon PNP Epitaxial Type (PCT process) (Transistor with Built-in Bias Resistor)...
Datasheet PDF File RN2902AFS PDF File

RN2902AFS
RN2902AFS

Overview
RN2901AFS~RN2906AFS TOSHIBA Transistor Silicon PNP Epitaxial Type (PCT process) (Transistor with Built-in Bias Resistor) RN2901AFS, RN2902AFS, RN2903AFS RN2904AFS, RN2905AFS, RN2906AFS Switching, Inverter Circuit, Interface Circuit and Driver Circuit Applications 1.
0±0.
05 Unit: mm • • • Incorporating a bias resistor into a transistor reduces the parts count.
Reducing the parts count enables the manufacture of ever more compact equipment and saves assembly cost.
Complementary to the RN1901AFS to RN1906AFS 0.
35 0.
35 1.
0±0.
05 0.
7±0.
05 1 2 3 6 5 4 0.
1±0.
05 C Type No.
RN2901AFS RN2902AFS R1 (kΩ) 4.
7 10 22 47 2.
2 4.
7 R2 (kΩ) 4.
7 10 22 47 47 47 0.
48 +0.
02 -0.
04 Equivalent Circuit and Bias Resistor Values B R1 R2 RN2903AFS RN2904AFS E RN2905AFS RN2906AFS fS6 JEDEC JEITA TOSHIBA 1.
EMITTER1 2.
BASE1 3.
COLLECTOR2 4.
EMITTER2 5.
BASE2 6.
COLLECTOR1 (E1) (B1) (C2) (E2) (B2) (C1) ― ― 2-1F1D Weight: 1 mg (typ.
) Absolute Maximum Ratings (Ta = 25°C) (Q1, Q2 common) Characteristic Collector-base voltage Collector-emitter voltage Emitter-base voltage Collector current Collector power dissipation Junction temperature Storage temperature range RN2901AFS to 2906AFS RN2901AFS to 2906AFS RN2901AFS to 2904AFS RN2905AFS, 2906AFS Symbol VCBO VCEO VEBO IC PC (Note 1) Tj Tstg Rating −50 −50 −10 −5 −80 50 150 −55 to 150 Unit V V Equivalent Circuit (top view) 6 5 4 Q1 V mA mW °C °C 1 2 Note: Using continuously under heavy loads (e.
g.
the application of high temperature/current/voltage and the significant change in temperature, etc.
) may cause this product to decrease in the reliability significantly even if the operating conditions (i.
e.
operating temperature/current/voltage, etc.
) are within the absolute maximum ratings.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.
e.
reliability test report and estimated failure rate, e...


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