DatasheetsPDF.com

NIV1161

ON Semiconductor
Part Number NIV1161
Manufacturer ON Semiconductor
Description ESD Protection
Published Jan 24, 2016
Detailed Description ESD Protection with Automotive Short-toBattery Blocking Low Capacitance ESD Protection with short−to−battery blocking fo...
Datasheet PDF File NIV1161 PDF File

NIV1161
NIV1161


Overview
ESD Protection with Automotive Short-toBattery Blocking Low Capacitance ESD Protection with short−to−battery blocking for Automotive High Speed Data Lines NIx1161 Series The NIx1161 series is designed to protect high speed data lines from ESD as well as short to vehicle battery situations.
The ultra−low capacitance and low ESD clamping voltage make this device an ideal solution for protecting voltage sensitive high speed data lines while the low RDS(on) FET limits distortion on the signal lines.
The flow−through style package allows for easy PCB layout and matched trace lengths necessary to maintain consistent impedance between high speed differential lines such as USB and LVDS protocols.
Features • Low Capacitance (0.
65 pF Typical, I/O to GND) • Protection for the Following Standards: IEC 61000−4−2 (Level 4) & ISO 10605 • Integrated MOSFETs: ♦ Short−to−Battery Blocking ♦ Short−to−USB VBUS Blocking • NIV1161MTWTAG − Wettable Flanks Device for optimal Automated Optical Inspection (AOI) • NIV Prefix for Automotive and Other Applications Requiring Unique Site and Control Change Requirements; AEC−Q101 Qualified and PPAP Capable • These Devices are Pb−Free, Halogen Free/BFR Free and are RoHS Compliant Typical Applications • Automotive High Speed Signal Pairs • USB 2.
0 • LVDS ABSOLUTE MAXIMUM RATINGS (TJ = 25°C unless otherwise noted) Rating Symbol Value Unit Operating Junction Temperature Range TJ(max) −55 to +150 °C Storage Temperature Range TSTG −55 to +150 °C Drain−to−Source Voltage VDSS 30 V Gate−to−Source Voltage VGS ±10 V Lead Temperature Soldering TSLD 260 °C IEC 61000−4−2 Contact (ESD) IEC 61000−4−2 Air (ESD) ESD ±8 kV ESD ±15 kV Stresses exceeding those listed in the Maximum Ratings table may damage the device.
If any of these limits are exceeded, device functionality should not be assumed, damage may occur and reliability may be affected.
www.
onsemi.
com MARKING DIAGRAM WDFN6 CASE 511CB V6 M 1 V6 = Specific Device Code M = Dat...


Similar Datasheet


@ 2014 :: Datasheetspdf.com :: Semiconductors datasheet search & download site. (Privacy Policy & Contact)