Part Number
|
SCANPSC110F |
Manufacturer
|
Fairchild Semiconductor |
Description
|
SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port |
Published
|
May 7, 2007 |
Detailed Description
|
SCANPSC110F SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port (IEEE1149.1 System Test Support)
March 1993 Re...
|
Datasheet
|
SCANPSC110F
|
Overview
SCANPSC110F SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port (IEEE1149.
1 System Test Support)
March 1993 Revised August 2000
SCANPSC110F SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port (IEEE1149.
1 System Test Support)
General Description
The SCANPSC110F Bridge extends the IEEE Std.
1149.
1 test bus into a multidrop test bus environment.
The advantage of a hierarchical approach over a single serial scan chain is improved test throughput and the ability to remove a board from the system and retain test access to the remaining modules.
Each SCANPSC110F Bridge supports up to 3 local scan rings which can be accessed individually or combined serially.
Addressing is accomp...
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