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SCANPSC110F

Fairchild Semiconductor
Part Number SCANPSC110F
Manufacturer Fairchild Semiconductor
Description SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port
Published May 7, 2007
Detailed Description SCANPSC110F SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port (IEEE1149.1 System Test Support) March 1993 Re...
Datasheet PDF File SCANPSC110F PDF File

SCANPSC110F
SCANPSC110F

Overview
SCANPSC110F SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port (IEEE1149.
1 System Test Support) March 1993 Revised August 2000 SCANPSC110F SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port (IEEE1149.
1 System Test Support) General Description The SCANPSC110F Bridge extends the IEEE Std.
1149.
1 test bus into a multidrop test bus environment.
The advantage of a hierarchical approach over a single serial scan chain is improved test throughput and the ability to remove a board from the system and retain test access to the remaining modules.
Each SCANPSC110F Bridge supports up to 3 local scan rings which can be accessed individually or combined serially.
Addressing is accomp...


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