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UT54ACS132E

Aeroflex Circuit Technology
Part Number UT54ACS132E
Manufacturer Aeroflex Circuit Technology
Description Quadruple 2-Input NAND Schmitt Triggers
Published Oct 6, 2016
Detailed Description UT54ACS132E Quadruple 2-Input NAND Schmitt Triggers October 2008 www.aeroflex.com/Logic FEATURES • 0.6μm CRH CMOS Proce...
Datasheet PDF File UT54ACS132E PDF File

UT54ACS132E
UT54ACS132E

Overview
UT54ACS132E Quadruple 2-Input NAND Schmitt Triggers October 2008 www.
aeroflex.
com/Logic FEATURES • 0.
6μm CRH CMOS Process - Latchup immune • High speed • Low power consumption • Wide operating power supply from 3.
0V to 5.
5V • Available QML Q or V processes • 14-lead flatpack DESCRIPTION The UT54ACS132 is a quadruple 2-input NAND gate with Schmitt Trigger input levels.
A high applied on both the inputs forces the output to a low state.
The devices are characterized over full HiRel temperature range of -55°C to +125°C.
LOGIC SYMBOL (1) A1 (2) B1 (4) A2 (5) B2 (9) A3 (10) B3 (12) A4 (13) B4 & (3) Y1 (6) Y2 (8) Y3 (11) Y4 Note: 1.
Logic symbol in accordance with ANSI/IEEE standard 91-1984 and IEC Publication 617-12.
FUNCTION TABLE INPUTS An Bn LL LH HL HH OUTPUT Yn H H H L PINOUT A1 B1 Y1 A2 B2 Y2 VSS 14-Lead Flatpack Top View 1 14 2 13 3 12 4 11 5 10 69 78 LOGIC DIAGRAM A1 B1 A2 B2 A3 B3 A4 B4 Y1 Y2 Y3 Y4 VDD B4 A4 Y4 B3 A3 Y3 1 OPERATIONAL ENVIRONMENT1 PARAMETER Total Dose SEU Threshold 2 SEL Threshold Neutron Fluence LIMIT 1.
0E6 80 120 1.
0E14 UNITS rads(Si) MeV-cm2/mg MeV-cm2/mg n/cm2 Notes: 1.
Logic will not latchup during radiation exposure within the limits defined in the table.
2.
Device storage elements are immune to SEU affects.
ABSOLUTE MAXIMUM RATINGS SYMBOL PARAMETER LIMIT UNITS VDD Supply voltage -0.
3 to 7.
0 V VI/O TSTG TJ TLS ΘJC II Voltage any pin Storage Temperature range Maximum junction temperature Lead temperature (soldering 5 seconds) Thermal resistance junction to case DC input current -.
3 to VDD + .
3 -65 to +150 +175 +300 20 ±10 V °C °C °C °C/W mA PD Maximum power dissipation 1W Note: 1.
Stresses outside the listed absolute maximum ratings may cause permanent damage to the device.
This is a stress rating only, functional operation of the device at these or any other conditions beyond limits indicated in the operational sections is not recommended.
Exposure to absolute maximum rating conditions for extended periods m...


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