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ATS19580

ALLEGRO
Part Number ATS19580
Manufacturer ALLEGRO
Description GMR Transmission Speed and Direction Sensor
Published May 11, 2020
Detailed Description ATS19580 Large Air Gap, GMR Transmission Speed and Direction Sensor IC for Gear Tooth Sensing FEATURES AND BENEFITS • ...
Datasheet PDF File ATS19580 PDF File

ATS19580
ATS19580

Overview
ATS19580 Large Air Gap, GMR Transmission Speed and Direction Sensor IC for Gear Tooth Sensing FEATURES AND BENEFITS • Fully integrated solution has GMR IC, protection capacitor, and back-bias magnet in a single in-line overmolded package • Innovative GMR technology provides large operational air gap sensing on ferromagnetic targets • Advanced algorithms for flexible design-in and system compensation □ Advanced vibration algorithms guarantee valid direction information □ Automatically adapts to extreme mechanical changes (air gap) and thermal drifts • Measures differentially to reject common-mode stray magnetic fields • Orientation compatible with Hall-effect technology • Integrated ASIL diagnostics and certified safety design process (optional fault reporting) 2 - PACKAGE: 3-pin SIP (suffix SN) Not to scale DESCRIPTION The ATS19580 is a giant magnetoresistance (GMR) integrated circuit (IC) that provides a user-friendly two-wire solution for applications where speed and direction information is required using ferromagnetic gear tooth targets.
The fully integrated package includes the GMR IC, a protection capacitor for EMC robustness, and a back-bias magnet in a single in-line package.
The GMR-based IC is designed for use with ferromagnetic gear tooth targets and is orientation-compatible with Hall-effect technology.
The fully integrated solution senses at large operating air gaps and over a large air gap range.
State-of-the-art GMR technology on a monolithic IC with industry-leading signal processing provides accurate speed and direction information in response to low-level differential magnetic signals.
The differential sensing offers inherent rejection of interfering common-mode magnetic fields.
Integrated diagnostics are used to detect an IC failure that would impact output protocol accuracy, providing coverage compatible with ASIL B.
Built-in EEPROM scratch memory offers traceability of the device throughout the IC’s product lifecycle.
ASIL reporting can be en...


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