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SN74LVC1G00-EP

Part Number	SN74LVC1G00-EP
Manufacturer	Texas Instruments
Description	SINGLE 2-INPUT POSITIVE-NAND GATE
Published	Jul 29, 2020
Detailed Description	www.ti.com FEATURES • Controlled Baseline – One Assembly/Test Site, One Fabrication Site • Enhanced Diminishing Manufact...
Datasheet	SN74LVC1G00-EP PDF File

Overview

www.
ti.
com FEATURES • Controlled Baseline – One Assembly/Test Site, One Fabrication Site • Enhanced Diminishing Manufacturing Sources (DMS) Support • Enhanced Product-Change Notification • Qualification Pedigree (1) • Supports 5-V VCC Operation • Inputs Accept Voltages to 5.
5 V • Max tpd of 3.
8 ns at 3.
3 V • Low Power Consumption, 10-µA Max ICC • ±24-mA Output Drive at 3.
3 V (1) Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range.
This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life.
Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.
SN74LVC1G00-EP SINGLE 2-INPUT POSITIVE-NAND GATE SCES450D – DECEMBER 2003 – REVISED SEPTEMBER 2006 • Ioff Supports Partial-Power-Down...

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