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SN54BCT8374A

Texas Instruments
Part Number SN54BCT8374A
Manufacturer Texas Instruments
Description SCAN TESTER
Published Nov 9, 2021
Detailed Description SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E − JUNE 1990 − REVISED ...
Datasheet PDF File SN54BCT8374A PDF File

SN54BCT8374A
SN54BCT8374A

Overview
SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E − JUNE 1990 − REVISED JULY 1996 D Members of the Texas Instruments SCOPE  Family of Testability Products D Octal Test-Integrated Circuits D Functionally Equivalent to ’F374 and ’BCT374 in the Normal-Function Mode D Compatible With the IEEE Standard 1149.
1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture D Test Operation Synchronous to Test Access Port (TAP) D Implement Optional Test Reset Signal by Recognizing a Double-High-Level Voltage (10 V ) on TMS Pin D SCOPE  Instruction Set − IEEE Standard 1149.
1-1990 Required Instructions, Optional INTEST, CLAMP, and HIGHZ − Parallel-Signat...


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