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SN54ABT18504

Part Number	SN54ABT18504
Manufacturer	Texas Instruments
Description	SCAN TEST DEVICE
Published	May 20, 2023
Detailed Description	• Members of the Texas Instruments SCOPE ™ Family of Testability Products • Members of the Texas Instruments Widebus ™ F...
Datasheet	SN54ABT18504 PDF File

Overview

• Members of the Texas Instruments SCOPE ™ Family of Testability Products • Members of the Texas Instruments Widebus ™ Family • Compatible With the IEEE Standard 1149.
1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture • UBT ™ (Universal Bus Transceiver) Combines D-Type Latches and D-Type Flip-Flops for Operation in Transparent, Latched, or Clocked Mode • Two Boundary-Scan Cells per I/O for Greater Flexibility • State-of-the-Art EPIC-ΙΙB ™ BiCMOS Design Significantly Reduces Power Dissipation SN54ABT18504, SN74ABT18504 SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS SCBS108B – AUGUST 1992 – REVISED JUNE 1993 • SCOPE ™ Instruction Set – IEEE Standard 1149.
1-1990 Required I...

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SN54ABT18502 SCAN TEST DEVICE - Texas Instruments
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