DatasheetsPDF.com

SN54ABT18640

Part Number	SN54ABT18640
Manufacturer	Texas Instruments
Description	SCAN TEST DEVICE
Published	May 20, 2023
Detailed Description	SN54ABT18640, SN74ABT18640 SCAN TEST DEVICES WITH 18-BIT INVERTING BUS TRANSCEIVERS SCBS267C – FEBRUARY 1994 – REVISED J...
Datasheet	SN54ABT18640 PDF File

Overview

SN54ABT18640, SN74ABT18640 SCAN TEST DEVICES WITH 18-BIT INVERTING BUS TRANSCEIVERS SCBS267C – FEBRUARY 1994 – REVISED JULY 1996 D Members of the Texas Instruments SCOPE ™ Family of Testability Products D Members of the Texas Instruments Widebus™ Family D Compatible With the IEEE Standard 1149.
1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture D SCOPE ™ Instruction Set – IEEE Standard 1149.
1-1990 Required Instructions and Optional CLAMP and HIGHZ – Parallel-Signature Analysis at Inputs – Pseudo-Random Pattern Generation From Outputs – Sample Inputs/Toggle Outputs – Binary Count From Outputs – Device Identification – Even-Parity Opcodes D State-of-the-Art EPIC-ΙΙB™ BiCMOS Design S...

Similar Datasheet

SN54ABT18640 SCAN TEST DEVICE - Texas Instruments

Since 2006. D4U Semicon,
Electronic Components Datasheet Search Site. (Privacy Policy & Contact)