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XMMAS500G10S

Motorola
Part Number XMMAS500G10S
Manufacturer Motorola
Description MICROMACHINED ACCELEROMETER 500g AMPLIFIED
Published Apr 16, 2005
Detailed Description MOTOROLA SEMICONDUCTOR TECHNICAL DATA Order this document by XMMAS500G/D Preliminary Information XMMAS500G10D XMMAS5...
Datasheet PDF File XMMAS500G10S PDF File

XMMAS500G10S
XMMAS500G10S


Overview
MOTOROLA SEMICONDUCTOR TECHNICAL DATA Order this document by XMMAS500G/D Preliminary Information XMMAS500G10D XMMAS500G10S MICROMACHINED ACCELEROMETER ± 500g AMPLIFIED Micromachined Accelerometer ± 500g Amplified The MMAS500G family of silicon capacitive, micro–machined accelerometers features integral signal amplification, signal conditioning, a 4–pole low–pass filter and temperature compensation.
Zero–G offset, full scale span and filter roll–off are factory set and require no external passives.
A calibrated self–test feature mechanically displaces the seismic mass with the application of a digital self–test signal.
The device is offered in either of two plastic packages, thereby accommodating various axis orientation requirements.
The MMAS500G incorporates a single polysilicon seismic mass, suspended between two fixed polysilicon plates (G–cell).
The forces of acceleration move the seismic mass, thereby resulting in a change in capacitance.
The G–cell is sealed at the die level, creating a particle–free environment.
The G–cell features built–in damping and over–range stops to protect it from mechanical shock.
MMAS500G accelerometers are ideally suited for automotive crash detection and recording, vibration monitoring, automotive suspension control, appliance control systems, etc.
Features • Full Scale Measurement ± 500g • Calibrated, True Self–Test • Standard 16–Pin Plastic DIP • Integral Signal Conditioning and 4–Pole Filter • Linear Output • Robust, High Shock Survivability 1 2 3 4 5 6 7 DIP PACKAGE CASE 648C–03 SIP PACKAGE CASE 447–01 PIN NUMBER N/C (1) N/C (1) N/C (1) Self–Test Output Bypass (2) GND VS (2) 9 10 11 12 13 14 15 16 N/C (1) N/C (1) N/C (1) N/C (1) N/C (1) N/C (1) N/C (1) N/C (1) SIMPLIFIED BLOCK DIAGRAM + + 8 + VS 8 4 SELF–TEST NOTES: 1.
Internal connections.
All N/C must remain floating, except DIP’s pin 11 which must be tied to pin 8.
2.
Bypass to ground with 0.
1 µF ceramic capacitor to improve noise performance.
g G–CELL A 6 BY...


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