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TC7W00FU

Toshiba
Part Number TC7W00FU
Manufacturer Toshiba
Description Dual 2-Input NAND Gate
Published Apr 23, 2005
Detailed Description TC7W00FU/FK TOSHIBA CMOS Digital Integrated Circuit Silicon Monolithic TC7W00FU, TC7W00FK Dual 2-Input NAND Gate Featu...
Datasheet PDF File TC7W00FU PDF File

TC7W00FU
TC7W00FU

Overview
TC7W00FU/FK TOSHIBA CMOS Digital Integrated Circuit Silicon Monolithic TC7W00FU, TC7W00FK Dual 2-Input NAND Gate Features • High Speed • Low power dissipation : tpd = 6ns (typ.
) at VCC = 5V : ICC = 1μA (max) at Ta = 25°C • High noise immunity : VNIH = VNIL = 28% VCC (min) • Output drive capability : 10 LSTTL Loads • Symmetrical Output Impedance : |IOH| = IOL= 4mA (min) • Balanced propagation delays : tpLH ≈ tpHL • Wide operating voltage range : VCC = 2 to 6 V TC7W00FU TC7W00FK (SM8) Marking SM8 US8 Product Name 7 W 0 0 Lot No.
W 00 Weight SSOP8-P-0.
65 SSOP8-P-0.
50A (US8) : 0.
02 g (typ.
) : 0.
01 g (typ.
) Pin Assignment (top view) 1A 1 1B 2 2Y 3 GND 4 8 VCC 7 1Y 6 2B 5 2A Start of commercial production 1991-09 1 2014-11-10 TC7W00FU/FK Absolute Maximum Ratings (Ta = 25°C) Characteristics Supply voltage DC input voltage DC output voltage Input diode current Output diode current DC output current DC VCC/ground current Power dissipation Storage temperature Lead temperature (10 s) Symbol VCC VIN VOUT IIK IOK IOUT ICC PD Tstg TL Rating Unit −0.
5 to 7.
0 V −0.
5 to VCC + 0.
5 V −0.
5 to VCC + 0.
5 V ±20 mA ±20 mA ±25 mA ±25 mA 300 (SM8) mW 200 (US8) −65 to 150 °C 260 °C Note: Using continuously under heavy loads (e.
g.
the application of high temperature/current/voltage and the significant change in temperature, etc.
) may cause this product to decrease in the reliability significantly even if the operating conditions (i.
e.
operating temperature/current/voltage, etc.
) are within the absolute maximum ratings and the operating ranges.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.
e.
reliability test report and estimated failure rate, etc).
IEC Logic Symbol IN A & IN B OUT Y Truth Table A B Y L L H L H H H L H H H L Operating Ranges Characteristics Supply voltage Input...


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