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TC7W125FU

Toshiba
Part Number TC7W125FU
Manufacturer Toshiba
Description Dual BUS Buffer
Published Apr 23, 2005
Detailed Description TC7W125FU TOSHIBA CMOS Digital Integrated Circuit Silicon Monolithic TC7W125FU Dual BUS Buffer The TC7W125FU is a high ...
Datasheet PDF File TC7W125FU PDF File

TC7W125FU
TC7W125FU

Overview
TC7W125FU TOSHIBA CMOS Digital Integrated Circuit Silicon Monolithic TC7W125FU Dual BUS Buffer The TC7W125FU is a high speed C2MOS Dual BUS Buffers fabricated with silicon gate C2MOS technology.
It achieves the high speed operation similar to equivalent LSTTL while maintaining the C2MOS low power dissipation.
The require 3-state control input G to be set high to place the output into the high impedance.
All inputs are equipped with protection circuits against static discharge or transient excess voltage.
Features • High speed: tpd = 10 ns (typ.
) at VCC = 5 V • Low power dissipation: ICC = 2 µA (max) at Ta = 25°C • High noise immunity: VNIH = VNIL = 28% VCC (min) • Output drive capability: 15 LSTTL loads • Symmetrical output impedance: |IOH| = IOL = 6 mA (min) • Balanced propagation delays: tpLH ∼− tpHL • Wide operating voltage range: VCC (opr) = 2 to 6 V Weight: 0.
02 g (typ.
) Absolute Maximum Ratings (Ta = 25°C) Characteristics Symbol Rating Unit Supply voltage range DC input voltage DC output voltage Input diode current Output diode current DC output current DC VCC/ground current Power dissipation Storage temperature range Lead temperature (10 s) VCC VIN VOUT IIK IOK IOUT ICC PD Tstg TL −0.
5 to 7 V −0.
5 to VCC + 0.
5 V −0.
5 to VCC + 0.
5 V ±20 mA ±20 mA ±35 mA ±37.
5 mA 300 mW −65 to 150 °C 260 °C Note: Using continuously under heavy loads (e.
g.
the application of high temperature/current/voltage and the significant change in temperature, etc.
) may cause this product to decrease in the reliability significantly even if the operating conditions (i.
e.
operating temperature/current/voltage, etc.
) are within the absolute maximum ratings and the operating ranges.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.
e.
reliability test report and estimated failure rate, etc).
Start of commercial product...


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