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TPCP8602

Toshiba Semiconductor
Part Number TPCP8602
Manufacturer Toshiba Semiconductor
Description Silicon PNP Transistor
Published Feb 20, 2010
Detailed Description TOSHIBA Transistor Silicon PNP Epitaxial Type TPCP8602 TPCP8602 High-Speed Switching Applications DC-DC Converter Appl...
Datasheet PDF File TPCP8602 PDF File

TPCP8602
TPCP8602

Overview
TOSHIBA Transistor Silicon PNP Epitaxial Type TPCP8602 TPCP8602 High-Speed Switching Applications DC-DC Converter Applications Strobe Flash Applications 0.
33±0.
05 0.
05 M A 8 5 Unit: mm 2.
4±0.
1 2.
8±0.
1 • High DC current gain: hFE = 200 to 500 (IC = −0.
3 A) • Low collector-emitter saturation: VCE (sat) = −0.
2 V (max) • High-speed switching: tf = 90 ns (typ.
) Absolute Maximum Ratings (Ta = 25°C) Characteristic Symbol Rating Unit 0.
475 1 4 0.
65 2.
9±0.
1 S 0.
025 S 0.
17±0.
02 B 0.
05 M B A 0.
8±0.
05 0.
28 +0.
1 -0.
11 Collector-base voltage VCBO −50 V Collector-emitter voltage VCEO −50 V Emitter-base voltage VEBO −7 V DC (Note 1) IC Collector current Pulse (Note 1 ) ICP −2.
5 A −4.
0 Base current IB −0.
25 A Collector power dissipation (t = 10s) t = 10s DC 3.
0 PC (Note 2) 1.
25 W Junction temperature Storage temperature range Tj 150 °C Tstg −55 to 150 °C 1.
12+-00.
.
1132 1.
12+-00.
.
1132 1.
Collector 2.
Collector 3.
Collector 4.
Base 5.
Emitter 6.
Collector 7.
Collector 8.
Collector 0.
28 +0.
1 -0.
11 JEDEC ― JEITA ― TOSHIBA 2-3V1A Weight: 0.
017 g (typ.
) Note 1: Ensure that the junction temperature does not exceed 150°C during use of this device.
Note 2: Mounted on an FR4 board (glass epoxy, 1.
6 mm thick, Cu area: 645 mm2) Note 3: Using continuously under heavy loads (e.
g.
the application of high temperature/current/voltage and the significant change in temperature, etc.
) may cause this product to decrease in the reliability significantly even if the operating conditions (i.
e.
operating temperature/current/voltage, etc.
) are within the absolute maximum ratings.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Precautions”/Derating Concept and Methods) and individual reliability data (i.
e.
reliability test report and estimated failure rate, etc).
Start of commercial production 2004-06 1 2013-11-01 Figure 1.
Circuit Configuration (top view) 8　 7 　6 　 5 TPCP8...


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