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RN2901FS

Toshiba
Part Number RN2901FS
Manufacturer Toshiba
Description Silicon PNP Transistor
Published Nov 11, 2013
Detailed Description RN2901FS~RN2906FS TOSHIBA Transistor Silicon PNP Epitaxial Type (PCT process) (Bias Resistor built-in Transistor) RN290...
Datasheet PDF File RN2901FS PDF File

RN2901FS
RN2901FS

Overview
RN2901FS~RN2906FS TOSHIBA Transistor Silicon PNP Epitaxial Type (PCT process) (Bias Resistor built-in Transistor) RN2901FS,RN2902FS,RN2903FS RN2904FS,RN2905FS,RN2906FS Switching, Inverter Circuit, Interface Circuit and Driver Circuit Applications 1.
0±0.
05 Unit: mm 1.
0±0.
05 Incorporating a bias resistor into a transistor reduces parts count.
Reducing the parts count enables the manufacture of ever more compact equipment and lowers assembly cost.
0.
7±0.
05 • 0.
35 0.
35 1 2 3 6 5 4 0.
1±0.
05 • Complementary to RN1901FS~RN1906FS +0.
02 -0.
04 Equivalent Circuit and Bias Resistor Values C Type No.
RN2901FS RN2902FS R2 RN2903FS RN2904FS E RN2905FS RN2906FS R1 (kΩ) 4.
7 10 22 47 2.
2 4.
7 R2 (kΩ) 4.
7 10 22 47 47 47 0.
48 B R1 fS6 JEDEC JEITA 1.
EMITTER1 2.
BASE1 3.
COLLECTOR2 4.
EMITTER2 5.
BASE2 6.
COLLECTOR1 (E1) (B1) (C2) (E2) (B2) (C1) ― ― 2-1F1D TOSHIBA Weight: 0.
001g (typ.
) Absolute Maximum Ratings (Ta = 25°C) (Q1, Q2 common) Characteristics Collector-base voltage Collector-emitter voltage Emitter-base voltage Collector current Collector power dissipation Junction temperature Storage temperature range RN2901FS~2906FS RN2901FS~2906FS RN2901FS~2904FS RN2905FS, 2906FS Symbol VCBO VCEO VEBO IC PC (Note 1) Tj Tstg Rating −20 −20 −10 −5 −50 50 150 −55~150 Unit V V V mA mW °C °C 1 2 3 Q1 Q2 Equivalent Circuit (top view) 6 5 4 Note: Using continuously under heavy loads (e.
g.
the application of high temperature/current/voltage and the significant change in temperature, etc.
) may cause this product to decrease in the reliability significantly even if the operating conditions (i.
e.
operating temperature/current/voltage, etc.
) are within the absolute maximum ratings.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.
e.
reliability test report and estimated failure rate, etc).
Note 1: Total rating 1 2007-11-01 Free Datasheet...


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