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RN2968CT

Toshiba
Part Number RN2968CT
Manufacturer Toshiba
Description Silicon PNP Transistor
Published Nov 11, 2013
Detailed Description RN2967CT~RN2969CT TOSHIBA Transistor Silicon PNP Epitaxial Type (PCT process) (Bias Resistor built-in Transistor) RN296...
Datasheet PDF File RN2968CT PDF File

RN2968CT
RN2968CT

Overview
RN2967CT~RN2969CT TOSHIBA Transistor Silicon PNP Epitaxial Type (PCT process) (Bias Resistor built-in Transistor) RN2967CT,RN2968CT,RN2969CT Switching, Inverter Circuit, Interface Circuit and Driver Circuit Applications 1.
0±0.
05 0.
15±0.
03 0.
2±0.
03 Unit: mm • • Two devices are incorporated into a fine pitch Small Mold (6 pin) 0.
9±0.
05 ６ ５ ４ 0.
6±0.
02 package.
Incorporating a bias resistor into a transistor reduces parts count.
Reducing the parts count enable the manufacture of ever more compact equipment and save assembly cost.
• Complementary to RN1967CT to RN1969CT １ 0.
2±0.
03 ２ ３ 0.
35±0.
02 0.
35±0.
02 0.
075±0.
03 0.
7±0.
03 Equivalent Circuit and Bias Resistor Values C Type No.
RN2967 CT RN2968 CT R2 RN2969 CT E R1 (kΩ) 10 22 47 R2 (kΩ) 47 47 22 1.
EMIITTER1 2.
EMITTER2 3.
BASE2 4.
COLLECTOR2 5.
BASE1 CST6 6.
COLLECTOR1 B R1 JEDEC JEITA TOSHIBA ― ― 2-1K1A Weight: 1.
0 mg (typ.
) Absolute Maximum Ratings (Ta = 25°C) (Q1, Q2 common) Equivalent Circuit Characteristics Collector-base voltage Collector-emitter voltage RN2967CT to RN2969CT RN2967CT Emitter-base voltage RN2968CT RN2969CT Collector current Collector power dissipation Junction temperature Storage temperature range RN2967CT to RN2969CT IC PC (Note1) Tj Tstg VEBO Symbol VCBO VCEO Rating −20 −20 −6 −7 −15 −50 50 150 −55 to 150 mA mW °C °C 1 2 3 V Q1 Unit V V 6 5 4 Q2 (top view) Note 1: Total rating Note 2: Using continuously under heavy loads (e.
g.
the application of high temperature/current/voltage and the significant change in temperature, etc.
) may cause this product to decrease in the reliability significantly even if the operating conditions (i.
e.
operating temperature/current/voltage, etc.
) are within the absolute maximum ratings.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.
e.
reliability test report and estimated failure rate, etc).
1 2010-05-...


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