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MUN2211T1

ON Semiconductor
Part Number MUN2211T1
Manufacturer ON Semiconductor
Description Bias Resistor Transistors
Published Jan 23, 2014
Detailed Description MUN2211T1 Series Preferred Devices Bias Resistor Transistors NPN Silicon Surface Mount Transistors with Monolithic Bias ...
Datasheet PDF File MUN2211T1 PDF File

MUN2211T1
MUN2211T1

Overview
MUN2211T1 Series Preferred Devices Bias Resistor Transistors NPN Silicon Surface Mount Transistors with Monolithic Bias Resistor Network This new series of digital transistors is designed to replace a single device and its external resistor bias network.
The BRT (Bias Resistor Transistor) contains a single transistor with a monolithic bias network consisting of two resistors; a series base resistor and a base−emitter resistor.
The BRT eliminates these individual components by integrating them into a single device.
The use of a BRT can reduce both system cost and board space.
The device is housed in the SC−59 package which is designed for low power surface mount applications.
Features • Simplifies Circuit Design • Reduces Board Space • Reduces Component Count • Moisture Sensitivity Level: 1 • ESD Rating − Human Body Model: Class 1 − Machine Model: Class B • The SC−59 Package can be Soldered Using Wave or Reflow • The Modified Gull−Winged Leads Absorb Thermal Stress During Soldering Eliminating the Possibility of Damage to the Die • Pb−Free Packages are Available MAXIMUM RATINGS (TA = 25°C unless otherwise noted) Rating Symbol Value Unit Collector-Base Voltage Collector-Emitter Voltage Collector Current THERMAL CHARACTERISTICS VCBO VCEO IC 50 Vdc 50 Vdc 100 mAdc Characteristic Symbol Max Unit Total Device Dissipation TA = 25°C Derate above 25°C PD 230 (Note 1) mW 338 (Note 2) 1.
8 (Note 1) °C/W 2.
7 (Note 2) Thermal Resistance, Junction-to-Ambient RqJA 540 (Note 1) °C/W 370 (Note 2) Thermal Resistance, Junction-to-Lead RqJL 264 (Note 1) °C/W 287 (Note 2) Junction and Storage Temperature Range TJ, Tstg −55 to +150 °C Maximum ratings are those values beyond which device damage can occur.
Maximum ratings applied to the device are individual stress limit values (not normal operating conditions) and are not valid simultaneously.
If these limits are exceeded, device functional operation is not implied, damage may occur and reliability may be affected.
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