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GT40RR21

TOSHIBA
Part Number GT40RR21
Manufacturer TOSHIBA
Description Silicon N-Channel IGBT
Published May 13, 2014
Detailed Description Discrete IGBTs Silicon N-Channel IGBT GT40RR21 GT40RR21 1. Applications • Dedicated to Voltage-Resonant Inverter Switc...
Datasheet PDF File GT40RR21 PDF File

GT40RR21
GT40RR21

Overview
Discrete IGBTs Silicon N-Channel IGBT GT40RR21 GT40RR21 1.
Applications • Dedicated to Voltage-Resonant Inverter Switching Applications Note: The product(s) described herein should not be used for any other application.
2.
Features (1) 6.
5th generation (2) The RC-IGBT consists of a freewheeling diode monolithically integrated in an IGBT chip.
(3) Enhancement mode (4) High-speed switching IGBT : tf = 0.
21 µs (typ.
) (IC = 40 A) FWD : trr = 0.
60 µs (typ.
) (IF = 15 A) (5) Low saturation voltage : VCE(sat) = 2.
05 V (typ.
) (IC = 40 A) (6) High junction temperature : Tj = 175 (max) 3.
Packaging and Internal Circuit TO-3P(N) 1: Gate 2: Collector 3: Emitter Start of commercial production 2012-04 1 2014-01-07 Rev.
2.
0 GT40RR21 4.
Absolute Maximum Ratings (Note) (Ta = 25, unless otherwise specified) Characteristics Symbol Rating Unit Collector-emitter voltage Gate-emitter voltage Collector current (DC) Collector current (DC) Collector current (3 µs) Collector current (1 ms) Diode forward current (DC) Diode forward current (100 µs) Collector power dissipation Junction temperature Storage temperature Mounting torque (Tc = 25) (Tc = 100) (Tc = 25) (Note 1) VCES VGES IC ICP IF IFP PC Tj Tstg TOR 1350 ±25 40 33 200 80 20 80 230 175 -55 to 175 0.
8 V A W  Nm Note: Using continuously under heavy loads (e.
g.
the application of high temperature/current/voltage and the significant change in temperature, etc.
) may cause this product to decrease in the reliability significantly even if the operating conditions (i.
e.
operating temperature/current/voltage, etc.
) are within the absolute maximum ratings.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook ("Handling Precautions"/"Derating Concept and Methods") and individual reliability data (i.
e.
reliability test report and estimated failure rate, etc).
In general, loss of IGBT increases more when it has positive temperature coefficient and gets higher temperatur...


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